Zoe Conroy

According to our database, Zoe Conroy authored at least 8 papers between 2005 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing.

Po-Fan Hou, Yi-Tsung Lin, Jiun-Lang Huang, Ann Shih, Zoe F. Conroy

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2014

Board manufacturing test correlation to IC manufacturing test.

C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy

Proceedings of the 2014 International Test Conference, 2014

Board security enhancement using new locking SIB-based architectures.

Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter

Proceedings of the 2014 International Test Conference, 2014

An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs.

Mehdi Sadi, Zoe Conroy, Bill Eklow, Matthias Kamm, Nematollah Bidokhti, Mark Mohammad Tehranipoor

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

BA-BIST: Board test from inside the IC out.

Zoe Conroy, Alfred L. Crouch

Proceedings of the 2013 IEEE International Test Conference, 2013

2012

Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox.

Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers

Proceedings of the 2012 IEEE International Test Conference, 2012

Are the IC guys helping or hindering board test?

Zoe Conroy

Proceedings of the 2012 IEEE International Test Conference, 2012

2005

A practical perspective on reducing ASIC NTFs.

Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005