Akira Nishiyama

Orcid: 0000-0001-5971-820X

According to our database1, Akira Nishiyama authored at least 13 papers between 2011 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2023
Process Planning with Removal of Melting Penetration and Temper Colors in 5-Axis Hybrid Additive and Subtractive Manufacturing.
Int. J. Autom. Technol., 2023

2021
Infrared Emission Spectroscopic Imaging of Microplastics Using Long-Wavelength Infrared Hyperspectral Camera with Imaging-Type Two-Dimensional Fourier Spectroscopy.
Proceedings of the 11th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing, 2021

2015
Electron transport mechanism of tungsten trioxide powder thin film studied by investigating effect of annealing on resistivity.
Microelectron. Reliab., 2015

Improvement of charge/discharge performance for lithium ion batteries with tungsten trioxide electrodes.
Microelectron. Reliab., 2015

2014
A novel hetero-junction Tunnel-FET using Semiconducting silicide-Silicon contact and its scalability.
Microelectron. Reliab., 2014

Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement.
Microelectron. Reliab., 2014

Chromatin Properties of Regulatory DNA Probed by Manipulation of Transcription Factors.
J. Comput. Biol., 2014

2013
Precision Controlled Variable Phase Filter for Imaging Type Two-Dimensional Spectroscopic Tomography.
Proceedings of the International Conference on Social Computing, SocialCom 2013, 2013

Advantage of TiN Schottky gate over conventional Ni for improved electrical characteristics in AlGaN/GaN HEMT.
Proceedings of the European Solid-State Device Research Conference, 2013

2012
Oxide and interface trap densities estimation in ultrathin W/La<sub>2</sub>O<sub>3</sub>/Si MOS capacitors.
Microelectron. Reliab., 2012

Resistive switching behavior of a CeO<sub>2</sub> based ReRAM cell incorporated with Si buffer layer.
Microelectron. Reliab., 2012

(100)- and (110)-oriented nMOSFETs with highly scaled EOT in La-silicate/Si interface for multi-gate architecture.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2011
Effects of La<sub>2</sub>O<sub>3</sub> incorporation in HfO<sub>2</sub> gated nMOSFETs on low-frequency noise.
Microelectron. Reliab., 2011


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