Albert Au

According to our database, Albert Au authored at least 6 papers between 2014 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Periodic Non-Destructive Memory BIST for Automotive Applications.

Wei Zou, Artur Pogiel, Albert Au, Martin Keim

Proceedings of the 43rd IEEE VLSI Test Symposium, 2025

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance.

Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim

Proceedings of the IEEE European Test Symposium, 2025

A Novel BIST Method for Multi-Port Register Files.

Andy Chen, Vianney Choserot, Munish Kumar, Khushal Gelda, Shreyas Pramod Dixit, Wei Zou, Jongsin Yun, Harshitha Kodali, Albert Au, Lori Schramm, Martin Keim

Proceedings of the IEEE European Test Symposium, 2025

2024

Power-Aware Test Scheduling for Memory BIST.

Albert Au, Michal Kçpinski, Makary Orczyk, Artur Pogiel

Proceedings of the IEEE International Test Conference, 2024

2018

Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions.

Venkat Yellapragada, Suresh Raman, Banadappa Shivaray, Luc Romain, Benoit Nadeau-Dostie, Martin Keim, Jean-Francois Cote, Albert Au, Giri Podichetty, Ashok Anbalan

Proceedings of the IEEE International Test Conference in Asia, 2018

2014

Quality assurance in memory built-in self-test tools.

Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada

Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014