Justyna Zawada

According to our database, Justyna Zawada authored at least 14 papers between 2014 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Efficient Test Compression Configuration Selection.

Chong-Siao Ye, Shi-Xuan Zheng, Fong-Jyun Tsai, Chen Wang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Justyna Zawada, Mark Kassab, Janusz Rajski

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2020

Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations.

Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada

Proceedings of the IEEE International Test Conference, 2020

Test Challenges of Intel IA Cores.

Uri Shpiro, Khen Wee, Kun-Han Tsai, Justyna Zawada, Xijiang Lin

Proceedings of the IEEE International Test Conference, 2020

2019

Logic BIST With Capture-Per-Clock Hybrid Test Points.

Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

2018

Hardware Protection via Logic Locking Test Points.

Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

On New Class of Test Points and Their Applications.

Janusz Rajski, Jerzy Tyszer, Justyna Zawada

Proceedings of the IEEE International Test Conference, 2018

2017

Embedded Deterministic Test Points.

Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada

IEEE Trans. Very Large Scale Integr. Syst., 2017

Full-scan LBIST with capture-per-cycle hybrid test points.

Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada

Proceedings of the IEEE International Test Conference, 2017

2016

On New Test Points for Compact Cell-Aware Tests.

Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada

IEEE Des. Test, 2016

Test point insertion in hybrid test compression/LBIST architectures.

Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada

Proceedings of the 2016 IEEE International Test Conference, 2016

On Test Points Enhancing Hardware Security.

Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015

Embedded deterministic test points for compact cell-aware tests.

Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada

Proceedings of the 2015 IEEE International Test Conference, 2015

Design for low test pattern counts.

Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada

Proceedings of the 52nd Annual Design Automation Conference, 2015

2014

Quality assurance in memory built-in self-test tools.

Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada

Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014