Alexis C. Vilas Bôas

According to our database, Alexis C. Vilas Bôas authored at least 3 papers between 2021 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments.

Saulo G. Alberton, Alexis C. Vilas Bôas, Jeffery Wyss, Vitor A. P. Aguiar, Matheus S. Pereira, Luca Silvestrin, Serena Mattiazzo, Alessandro Paccagnella, Carlo Cazzaniga, Maria Kastriotou, Christopher D. Frost, Nilberto H. Medina

IEEE Access, 2025

Exploring Fault Tolerance to Ionizing Radiation in Severe Environments: Power Transistors with Distinct Layouts.

Paulo R. Garcia, Guilherme I Grandesi, Alexis C. Vilas Bôas, Renato C. Giacomini, Nilberto H. Medina, Luis Eduardo Seixas Jr., Marcilei Aparecida Guazzelli

Proceedings of the 16th IEEE Latin America Symposium on Circuits and Systems, 2025

2021

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.

Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen

J. Electron. Test., 2021