Maria Kastriotou

According to our database, Maria Kastriotou authored at least 9 papers between 2018 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments.

Saulo G. Alberton, Alexis C. Vilas Bôas, Jeffery Wyss, Vitor A. P. Aguiar, Matheus S. Pereira, Luca Silvestrin, Serena Mattiazzo, Alessandro Paccagnella, Carlo Cazzaniga, Maria Kastriotou, Christopher D. Frost, Nilberto H. Medina

IEEE Access, 2025

Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments.

Nikolaos Chatzivangelis, Nikolaos Zazatis, Wesley Grignani, Georgios Ioannis Paliaroutis, Douglas A. dos Santos, Carolina Imianosky, Maria Kastriotou, Carlo Cazzaniga, Frédéric Wrobel, Alessandro Veronesi, Christos P. Sotiriou, Marko S. Andjelkovic, Fabian Luis Vargas, Davide Bertozzi, Luigi Dilillo

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2025

2024

Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation.

Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Ruiqi Ye, John Goodacre, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga, Chris Frost

IEEE Trans. Reliab., March, 2024

2022

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks.

Lucas Matana Luza, Annachiara Ruospo, Daniel Söderström, Carlo Cazzaniga, Maria Kastriotou, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo

IEEE Trans. Emerg. Top. Comput., 2022

Evaluation of Xilinx Deep Learning Processing Unit under Neutron Irradiation.

Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga

CoRR, 2022

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip.

Douglas A. dos Santos, André Martins Pio de Mattos, Lucas M. Luza, Carlo Cazzaniga, Maria Kastriotou, Douglas R. Melo, Luigi Dilillo

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Characterization of a RISC-V System-on-Chip under Neutron Radiation.

Douglas A. dos Santos, Lucas M. Luza, Maria Kastriotou, Carlo Cazzaniga, Cesar A. Zeferino, Douglas R. Melo, Luigi Dilillo

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study.

Lucas Matana Luza, Daniel Söderström, André Martins Pio de Mattos, Eduardo Augusto Bezerra, Carlo Cazzaniga, Maria Kastriotou, Christian Poivey, Luigi Dilillo

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

2018

FPGA SEE Test with Ultra-High Energy Heavy Ions.

Gianluca Furano, Antonis Tavoularis, Lucana Santos, Veronique Ferlet-Cavrois, Cesar Boatella, Ruben Garcia Alia, Pablo Fernández-Martínez, Maria Kastriotou, Vanessa Wyrwoll, Salvatore Danzeca, Maris Tali, Dejan Gacnik, Iztok Kramberger, Lars Juul, Konstantinos Maragos, George Lentaris

Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018