Carlos J. González

According to our database, Carlos J. González authored at least 6 papers between 2017 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems.

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen

J. Electron. Test., August, 2023

2021

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.

Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen

J. Electron. Test., 2021

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems.

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. de Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2020

Influence of sampling frequency on TID response of SAR ADCs.

Bruno L. Costa, Carlos J. González, Rafael Galhardo Vaz, Odair Lelis Gonçalez, Tiago R. Balen

Proceedings of the IEEE Latin-American Test Symposium, 2020

2019

Electromagnetic Immunity Test of Analog-to-Digital Interfaces of a Mixed-Signal Programmable SoC.

Luiz G. S. Dias, Carlos J. González, Fernando J. Boeira, Tiago R. Balen

Proceedings of the IEEE Latin American Test Symposium, 2019

2017

Evaluation of a mixed-signal design diversity system under radiation effects.

Carlos J. González, Cristiano P. Chenet, Matheus Budelon, Rafael Galhardo Vaz, Odair Lelis Goncalez, Tiago R. Balen

Proceedings of the 18th IEEE Latin American Test Symposium, 2017