Helmut Puchner

According to our database, Helmut Puchner authored at least 8 papers between 2001 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories.

Golnaz Korkian, Daniel León, Francisco J. Franco, Juan Carlos Fabero, Manon Letiche, Yolanda Morilla, Pedro Martín-Holgado, Helmut Puchner, Hortensia Mecha, Juan Antonio Clemente

IEEE Access, 2022

2021

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.

Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen

J. Electron. Test., 2021

Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs.

Mohammadreza Rezaei, Francisco J. Franco, Juan Carlos Fabero, Hortensia Mecha, Helmut Puchner, Juan Antonio Clemente

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2020

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM.

Lucas Matana Luza, Daniel Söderström, Helmut Puchner, Rubén García Alía, Manon Letiche, Alberto Bosio, Luigi Dilillo

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems.

Lucas Matana Luza, Daniel Söderström, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2007

NBTI product level reliability for a low-power SRAM technology.

Helmut Puchner

Microelectron. Reliab., 2007

2004

Leakage Increase of Narrow and Short BCPMOS.

Y. Z. Xu, O. Pohland, C. Cai, Helmut Puchner

Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004

2001

Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies.

Helmut Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti

Microelectron. Reliab., 2001