Huaguo Liang

Orcid: 0000-0002-0307-7236

According to our database1, Huaguo Liang authored at least 113 papers between 2001 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

Online presence:

On csauthors.net:

Bibliography

2024
A Self-Biased Current Reference Source-Based Pre-Bond TSV Test Solution.
IEEE Trans. Very Large Scale Integr. Syst., April, 2024

Designs of High-Speed Triple-Node-Upset Hardened Latch Based on Dual-Modular-Redundancy.
J. Circuits Syst. Comput., March, 2024

Reliability analysis and comparison of ring-PUF based on probabilistic models.
Microelectron. J., February, 2024

A Reliability-Aware Splitting Duty-Cycle Physical Unclonable Function Based on Trade-off Process, Voltage, and Temperature Variations.
ACM Trans. Design Autom. Electr. Syst., January, 2024

Design Guidelines and Feedback Structure of Ring Oscillator PUF for Performance Improvement.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., January, 2024

2023
RMC_NoC: A Reliable On-Chip Network Architecture With Reconfigurable Multifunctional Channel.
IEEE Trans. Very Large Scale Integr. Syst., December, 2023

High-efficiency TRNG Design Based on Multi-bit Dual-ring Oscillator.
ACM Trans. Reconfigurable Technol. Syst., December, 2023

Overhead Optimized and Quadruple-Node-Upset Self-Recoverable Latch Design Based on Looped C-Element Matrix.
IEEE Trans. Aerosp. Electron. Syst., December, 2023

Improving power and performance of on-chip network through virtual channel sharing and power gating.
Integr., November, 2023

Low-overhead TRNG based on MUX for cryptographic protection using multiphase sampling.
J. Supercomput., October, 2023

URMP: using reconfigurable multicast path for NoC-based deep neural network accelerators.
J. Supercomput., September, 2023

Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction.
J. Circuits Syst. Comput., August, 2023

Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets.
J. Electron. Test., June, 2023

Design of approximate Booth multipliers based on error compensation.
Integr., May, 2023

Dynamic detection of wireless interface faults and fault-tolerant routing algorithm in WiNoC.
Integr., May, 2023

Energy-Efficient Multiple Network-on-Chip Architecture With Bandwidth Expansion.
IEEE Trans. Very Large Scale Integr. Syst., April, 2023

A dynamically reconfigurable entropy source circuit for high-throughput true random number generator.
Microelectron. J., March, 2023

Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern.
Microelectron. J., 2023

Fault-avoidance C-element based low overhead and TNU-resilient latch.
Microelectron. J., 2023

LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy.
Integr., 2023

2022
A router architecture with dual input and dual output channels for Networks-on-Chip.
Microprocess. Microsystems, April, 2022

Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator.
IEEE Trans. Circuits Syst. II Express Briefs, 2022

M-RO PUF: A portable pure digital RO PUF based on MUX unit.
Microelectron. J., 2022

A reconfigurable PUF structure with dual working modes based on entropy separation model.
Microelectron. J., 2022

REE: Reconfigurable and energy-efficient router architecture in wireless network-on-chip.
Microelectron. J., 2022

Design of fully adaptive routing and hybrid VC allocation in wireless NOC.
Microelectron. J., 2022

Architecting a congestion pre-avoidance and load-balanced wireless network-on-chip.
J. Parallel Distributed Comput., 2022

Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements.
J. Circuits Syst. Comput., 2022

A reconfigurable test method based on LFSR for 3D stacking integrated circuits.
Integr., 2022

A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design.
J. Electron. Test., 2022

A Lightweight M_TRNG Design based on MUX Cell Entropy using Multiphase Sampling.
Proceedings of the Asian Hardware Oriented Security and Trust Symposium, 2022

2021
Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System.
IEEE Trans. Very Large Scale Integr. Syst., 2021

Pure Digital Scalable Mixed Entropy Separation Structure for Physical Unclonable Function and True Random Number Generator.
IEEE Trans. Very Large Scale Integr. Syst., 2021

High-Throughput Portable True Random Number Generator Based on Jitter-Latch Structure.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021

A Cost-Effective TSV Repair Architecture for Clustered Faults in 3-D IC.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

A high reliability physically unclonable function based on multiple tunable ring oscillator.
Microelectron. J., 2021

Architecting a priority-based dynamic media access control mechanism in Wireless Network-on-Chip.
Microelectron. J., 2021

A high-speed and triple-node-upset recovery latch with heterogeneous interconnection.
Microelectron. J., 2021

LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS.
Microelectron. J., 2021

Design of MNU-Resilient latches based on input-split C-elements.
Microelectron. J., 2021

Design of node separated triple-node-upset self-recoverable latch.
Microelectron. J., 2021

Approximate multipliers based on a novel unbiased approximate 4-2 compressor.
Integr., 2021

Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs.
IEICE Electron. Express, 2021

Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems.
J. Electron. Test., 2021

Design of a Highly Robust Triple-Node-Upset Self-Recoverable Latch.
IEEE Access, 2021

A N: 1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs.
Proceedings of the IEEE International Test Conference in Asia, 2021

2020
Architecture of Cobweb-Based Redundant TSV for Clustered Faults.
IEEE Trans. Very Large Scale Integr. Syst., 2020

Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC.
IEEE Trans. Circuits Syst., 2020

LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Design of a Wireless Router with Virtual Channel Fault Tolerant in WiNoC.
J. Circuits Syst. Comput., 2020

cm<sup>3</sup>WiNoCs: Congestion-Aware Millimeter-Wave Multichannel Wireless Networks-on-Chip.
IEEE Access, 2020

Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm.
IEEE Access, 2020

A Novel Low-Latency Regional Fault-Aware Fault-Tolerant Routing Algorithm for Wireless NoC.
IEEE Access, 2020

Jitter-Quantizing-Based TRNG Robust Against PVT Variations.
IEEE Access, 2020

Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

A Hybrid Computing Architecture for Fault-tolerant Deep Learning Accelerators.
Proceedings of the 38th IEEE International Conference on Computer Design, 2020

Multi-task Scheduling for PIM-based Heterogeneous Computing System.
Proceedings of the GLSVLSI '20: Great Lakes Symposium on VLSI 2020, 2020

2019
A Pulse Shrinking-Based Test Solution for Prebond Through Silicon via in 3-D ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

Design of Wireless Network on Chip with Priority-Based MAC.
J. Circuits Syst. Comput., 2019

CPCA: An efficient wireless routing algorithm in WiNoC for cross path congestion awareness.
Integr., 2019

DVFS Based Error Avoidance Strategy in Wireless Network-on-Chip.
J. Electron. Test., 2019

Temperature-Aware Floorplanning for Fixed-Outline 3D ICs.
IEEE Access, 2019

Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019

A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells.
Proceedings of the IEEE International Test Conference in Asia, 2019

2018
Design of Low-Power WiNoC with Congestion-Aware Wireless Node.
J. Circuits Syst. Comput., 2018

An improved communication scheme for non-HOL-blocking wireless NoC.
Integr., 2018

MTTF-Aware Reliability Task Scheduling for PIM-Based Heterogeneous Computing System.
Proceedings of the IEEE International Test Conference in Asia, 2018

Novel low cost and DNU online self-recoverable RHBD latch design for nanoscale CMOS.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

A High Reliability FPGA Chip Identification Generator Based on PDLs.
Proceedings of the 27th IEEE Asian Test Symposium, 2018

An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs.
Proceedings of the 27th IEEE Asian Test Symposium, 2018

A Low-Cost High-Efficiency True Random Number Generator on FPGAs.
Proceedings of the 27th IEEE Asian Test Symposium, 2018

A Hybrid DMR Latch to Tolerate MNU Using TDICE and WDICE.
Proceedings of the 27th IEEE Asian Test Symposium, 2018

A Dictionary-Based Test Data Compression Method Using Tri-State Coding.
Proceedings of the 27th IEEE Asian Test Symposium, 2018

2017
Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology.
IEEE Trans. Very Large Scale Integr. Syst., 2017

A TSV Fault-Tolerant Scheme Based on Failure Classification in 3D-NoC.
J. Circuits Syst. Comput., 2017

A Region-Based Through-Silicon via Repair Method for Clustered Faults.
IEICE Trans. Electron., 2017

Highly Robust Double Node Upset Resilient Hardened Latch Design.
IEICE Trans. Electron., 2017

A transient pulse dually filterable and online self-recoverable latch.
IEICE Electron. Express, 2017

A highly reliable butterfly PUF in SRAM-based FPGAs.
IEICE Electron. Express, 2017

A single event transient detector in SRAM-based FPGAs.
IEICE Electron. Express, 2017

Vernier ring based pre-bond through silicon vias test in 3D ICs.
IEICE Electron. Express, 2017

HLDTL: High-performance, low-cost, and double node upset tolerant latch design.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2016
An SEU resilient, SET filterable and cost effective latch in presence of PVT variations.
Microelectron. Reliab., 2016

AFTER: Asynchronous Fault-Tolerant Router Design in Network-on-Chip.
J. Circuits Syst. Comput., 2016

Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures.
IEICE Trans. Inf. Syst., 2016

Co-mitigating circuit PBTI and HCI aging considering NMOS transistor stacking effect.
Proceedings of the International Symposium on Integrated Circuits, 2016

NBTI mitigation by M-IVC with input duty cycle and randomness constraints.
Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

Novel Low Cost and Double Node Upset Tolerant Latch Design for Nanoscale CMOS Technology.
Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015
A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology.
IEICE Trans. Electron., 2015

A High Performance SEU Tolerant Latch.
J. Electron. Test., 2015

Pulse shrinkage based pre-bond through silicon vias test in 3D IC.
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

NBTI-induced circuit aging optimization by protectability-aware gate replacement technique.
Proceedings of the 16th Latin-American Test Symposium, 2015

MTTF-Aware Reliability Task Scheduling for Heterogeneous Multicore System.
Proceedings of the Algorithms and Architectures for Parallel Processing, 2015

2014
Optimized stacking order for 3D-stacked ICs considering the probability and cost of failed bonding.
Proceedings of the Technical Papers of 2014 International Symposium on VLSI Design, 2014

Design of a Radiation Hardened Latch for Low-Power Circuits.
Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013
A dynamic self-adaptive correction method for error resilient application.
Proceedings of the Design, Automation and Test in Europe, 2013

2010
A Novel x -ploiting Strategy for Improving Performance of Test Data Compression.
IEEE Trans. Very Large Scale Integr. Syst., 2010

A scheme of test data compression based on coding of even bits marking and selective output inversion.
Comput. Electr. Eng., 2010

2009
Impact of Hazards on Pattern Selection for Small Delay Defects.
Proceedings of the 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, 2009

A Test Vector Compression/Decompression Scheme Based on Logic Operation between Adjacent Bits (LOBAB) Coding.
Proceedings of the 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, 2009

Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing.
Proceedings of the 12th IEEE International Conference on Computational Science and Engineering, 2009

2008
Balancing wrapper chains of SoC core based on best interchange decreasing.
Proceedings of the 2008 IEEE International Symposium on System-on-Chip, 2008

A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies.
Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter.
Proceedings of the 9th International Conference for Young Computer Scientists, 2008

2007
Test data compression scheme based on variable-to-fixed-plus-variable-length coding.
J. Syst. Archit., 2007

A Novel Collaborative Scheme of Test Data Compression Based on Fixed-Plus-variable-Length Coding.
Proceedings of the 11th International Conference on Computer Supported Cooperative Work in Design, 2007

Block Marking and Updating Coding in Test Data Compression for SoC.
Proceedings of the 16th Asian Test Symposium, 2007

2005
A BIST Scheme Based on Selecting State Generation of Folding Counters.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2003
A new technique for deterministic scan based built in self test (BIST).
PhD thesis, 2003

Sharing BIST with Multiple Cores for System-on-a-Chip.
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2002
A Mixed-Mode BIST Scheme Based on Folding Compression.
J. Comput. Sci. Technol., 2002

Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.
J. Electron. Test., 2002

2001
A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.
J. Electron. Test., 2001


  Loading...