Fumiyoshi Matsuoka

According to our database, Fumiyoshi Matsuoka authored at least 4 papers between 2009 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

30.6 A 64Gb DDR4 STT-MRAM Using a Time-Controlled Discharge-Reading Scheme for a .001681µm 1T-1MTJ Cross-Point Cell.

Kosuke Hatsuda, Katsuhiko Hoya, Ryosuke Takizawa, Fumiyoshi Matsuoka, Takaya Yasuda, Akira Katayama, Tadashi Miyakawa, Kazuyo Senju, Kazuki Okawa, Yuka Furukawa, Yu Shimada, Katsuya Kotake, Sayaka Hirokawa, Min Chul Shin, Dong Keun Kim, Tae Ho Kim, Kyunghoon Kim, Hisanori Aikawa, Jeonghwan Song, Toshihiko Nagase, Soo Man Seo, Soo Gil Kim, Seonyong Cha

Proceedings of the IEEE International Solid-State Circuits Conference, 2025

2011

Generation of Accurate Reference Current for Data Sensing in High-Density Memories by Averaging Multiple Pairs of Dummy Cells.

Takashi Ohsawa, Kosuke Hatsuda, Katsuyuki Fujita, Fumiyoshi Matsuoka, Tomoki Higashi

IEEE J. Solid State Circuits, 2011

2010

A 1.6 GB/s DDR2 128 Mb Chain FeRAM With Scalable Octal Bitline and Sensing Schemes.

Hidehiro Shiga, Daisaburo Takashima, Shinichiro Shiratake, Katsuhiko Hoya, Tadashi Miyakawa, Ryu Ogiwara, Ryo Fukuda, Ryosuke Takizawa, Kosuke Hatsuda, Fumiyoshi Matsuoka, Yasushi Nagadomi, Daisuke Hashimoto, Hisaaki Nishimura, Takeshi Hioka, Sumiko M. Doumae, Shoichi Shimizu, Mitsumo Kawano, Toyoki Taguchi, Yohji Watanabe, Shuso Fujii, Tohru Ozaki, Hiroyuki Kanaya, Yoshinori Kumura, Yoshiro Shimojo, Yuki Yamada, Yoshihiro Minami, Susumu Shuto, Koji Yamakawa, Soichi Yamazaki, Iwao Kunishima, Takeshi Hamamoto, Akihiro Nitayama, Tohru Furuyama

IEEE J. Solid State Circuits, 2010

2009

A 1.6GB/s DDR2 128Mb chain FeRAM with scalable octal bitline and sensing schemes.

Hidehiro Shiga, Daisaburo Takashima, Shinichiro Shiratake, Katsuhiko Hoya, Tadashi Miyakawa, Ryu Ogiwara, Ryo Fukuda, Ryosuke Takizawa, Kosuke Hatsuda, Fumiyoshi Matsuoka, Yasushi Nagadomi, Daisuke Hashimoto, Hisaaki Nishimura, Takeshi Hioka, Sumiko M. Doumae, Shoichi Shimizu, Mitsumo Kawano, Toyoki Taguchi, Yohji Watanabe, Shuso Fujii, Tohru Ozaki, Hiroyuki Kanaya, Yoshinori Kumura, Yoshiro Shimojo, Yuki Yamada, Yoshihiro Minami, Susumu Shuto, Koji Yamakawa, Soichi Yamazaki, Iwao Kunishima, Takeshi Hamamoto, Akihiro Nitayama, Tohru Furuyama

Proceedings of the IEEE International Solid-State Circuits Conference, 2009