Georgios Ioannis Paliaroutis

According to our database, Georgios Ioannis Paliaroutis authored at least 12 papers between 2016 and 2025.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of four.

2025

Fault Injection Attacks Based on Layout-Driven SER Analysis.

Alexandra Takou, Pelopidas Tsoumanis, Georgios Ioannis Paliaroutis, Nestor E. Evmorfopoulos, George I. Stamoulis

Proceedings of the 21st International Conference on Synthesis, 2025

Compact SER Models via Model Order Reduction of Diffusion-Based Charge Collection.

Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios Ioannis Paliaroutis, George Floros

Proceedings of the 21st International Conference on Synthesis, 2025

Multi-Partner Project: Twinning for Excellence in Reliable Electronics (TWIN-RELECT).

Marko S. Andjelkovic, Fabian Vargas, Milos Krstic, Luigi Dilillo, Alain Michez, Frederic Wrobel, Davide Bertozzi, Mikel Luján, Christos Georgakidis, Nikolaos Chatzivangelis, Katerina Tsilingiri, Nikolaos Zazatis, Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Christos P. Sotiriou

Proceedings of the Design, Automation & Test in Europe Conference, 2025

2024

Sensitivity-aware Hardware Trojan Injection for SET Propagation and Soft Error Attacks.

Alexandra Takou, Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Nestoras E. Evmorfopoulos, Georgios I. Stamoulis

Proceedings of the 20th International Conference on Synthesis, 2024

Power Consumption Assessment of Telecommunication Base Stations Harnessing Prototype Energy Models.

Athanasios Fevgas, John A. Korinthios, Panagiota E. Tsompanopoulou, Nikolaos Frangogiannis, Pelopidas Tsoumanis, Georgios Ioannis Paliaroutis, Alexandra Takou, Georgios I. Stamoulis

Proceedings of the 15th International Conference on Information, 2024

2023

Accurate Soft Error Rate Evaluation Using Event-Driven Dynamic Timing Analysis.

Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Dimitrios Garyfallou, Anastasis Vagenas, Nestoras E. Evmorfopoulos, Georgios I. Stamoulis

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2021

On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies.

Pelopidas Tsoumanis, Georgios Ioannis Paliaroutis, Nestoras E. Evmorfopoulos, George I. Stamoulis

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2020

A Layout-Based Soft Error Rate Estimation and Mitigation in the Presence of Multiple Transient Faults in Combinational Logic.

Christos Georgakidis, Georgios Ioannis Paliaroutis, Nikolaos Sketopoulos, Pelopidas Tsoumanis, Christos P. Sotiriou, Nestor E. Evmorfopoulos, Georgios I. Stamoulis

Proceedings of the 21st International Symposium on Quality Electronic Design, 2020

2019

Multiple Transient Faults in Combinational Logic with Placement Considerations.

Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Nestor E. Evmorfopoulos, George Dimitriou, Georgios I. Stamoulis

Proceedings of the 8th International Conference on Modern Circuits and Systems Technologies, 2019

2018

A Placement-Aware Soft Error Rate Estimation of Combinational Circuits for Multiple Transient Faults in CMOS Technology.

Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Nestor E. Evmorfopoulos, George Dimitriou, Georgios I. Stamoulis

Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018

2017

Placement-based SER estimation in the presence of multiple faults in combinational logic.

Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Nestor E. Evmorfopoulos, George Dimitriou, Georgios I. Stamoulis

Proceedings of the 27th International Symposium on Power and Timing Modeling, 2017

2016

SER Analysis of Multiple Transient Faults in Combinational Logic.

Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, George Dimitriou, Georgios I. Stamoulis

Proceedings of the SouthEast European Design Automation, 2016