Nikolaos Zazatis

According to our database, Nikolaos Zazatis authored at least 5 papers between 2025 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2026

Cross-Layer Reliability Analysis of Slimmable Neural Networks under Permanent Faults.

Nikolaos Zazatis, Alessandro Veronesi, Konstantinos Varakliotis, Pelopidas Tsoumanis, Christos P. Sotiriou, Letícia Maria Bolzani Pöhls, Marko S. Andjelkovic, Davide Bertozzi

Proceedings of the 44th IEEE VLSI Test Symposium, 2026

Soft Error Reliability Analysis & Hardening of NVDLA MAC Units.

Nikolaos Chatzivangelis, Nikolaos Betsos, Georgios Ioannis Paliaroutis, Nikolaos Zazatis, Pelopidas Tsoumanis, Frederic Wrobel, Marko S. Andjelkovic, Christos P. Sotiriou, Luigi Dilillo

Proceedings of the 44th IEEE VLSI Test Symposium, 2026

2025

Prediction of Single Event Transient Propagation Using Machine Learning Models.

Marko S. Andjelkovic, Junchao Chen, Jelisaveta Aleksic, Vishnu Padmakumar, Milos Marjanovic, Nikolaos Zazatis, Trupti Ranjan Lenka, Danijel Dankovic, Christos P. Sotiriou, Fabian Vargas

Proceedings of the 21st International Conference on Synthesis, 2025

Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments.

Nikolaos Chatzivangelis, Nikolaos Zazatis, Wesley Grignani, Georgios Ioannis Paliaroutis, Douglas A. dos Santos, Carolina Imianosky, Maria Kastriotou, Carlo Cazzaniga, Frédéric Wrobel, Alessandro Veronesi, Christos P. Sotiriou, Marko S. Andjelkovic, Fabian Luis Vargas, Davide Bertozzi, Luigi Dilillo

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2025

Multi-Partner Project: Twinning for Excellence in Reliable Electronics (TWIN-RELECT).

Marko S. Andjelkovic, Fabian Vargas, Milos Krstic, Luigi Dilillo, Alain Michez, Frederic Wrobel, Davide Bertozzi, Mikel Luján, Christos Georgakidis, Nikolaos Chatzivangelis, Katerina Tsilingiri, Nikolaos Zazatis, Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Christos P. Sotiriou

Proceedings of the Design, Automation & Test in Europe Conference, 2025