Ichiro Omura

According to our database, Ichiro Omura authored at least 27 papers between 2007 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Multipurpose Strategy for Energy Storage System Based on Capital Asset Pricing Model With Ensemble Approach.

Kazufumi Yuasa, Miki Ueshima, Tadatoshi Babasaki, Ichiro Omura

IEEE Access, 2021

2019

Switching of 3300V Scaled IGBT by 5V Gate Drive.

Toshiro Hiramoto, Katsumi Satoh, Tomoko Matsudai, Wataru Saito, Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Naoyuki Shigyo, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Atsushi Ogura, Shinichi Nishizawa, Ichiro Omura, Hiromichi Ohashi, Kazuo Itou, Toshihiro Takakura, Munetoshi Fukui, Shinichi Suzuki, Ken Takeuchi, Masanori Tsukuda, Yohichiroh Numasawa

Proceedings of the 13th IEEE International Conference on ASIC, 2019

2018

A power cycling degradation inspector of power semiconductor devices.

Akihiko Watanabe, Ichiro Omura

Microelectron. Reliab., 2018

Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena.

Masanori Tsukuda, Seiya Abe, Kazunori Hasegawa, Tamotsu Ninomiya, Ichiro Omura

Microelectron. Reliab., 2018

A fully digital feedback control of gate driver for current balancing of parallel connected power devices.

Ravi N. Tripathi, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2018

ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier.

Kazunori Hasegawa, Shinichi Nishizawa, Ichiro Omura

Microelectron. Reliab., 2018

Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system.

Bat-Otgon Bat-Ochir, Battuvshin Bayarkhuu, Kazunori Hasegawa, Masanori Tsukuda, Bayasgalan Dugarjav, Ichiro Omura

Microelectron. Reliab., 2018

2017

Real-time imaging of temperature distribution inside a power device under a power cycling test.

Akihiko Watanabe, R. Nagao, Ichiro Omura

Microelectron. Reliab., 2017

Clamp type built-in current sensor using PCB in high-voltage power modules.

Masanori Tsukuda, K. Nakashima, S. Tabata, Kazunori Hasegawa, Ichiro Omura

Microelectron. Reliab., 2017

Modelling of the shoot-through phenomenon introduced by the next generation IGBT in inverter applications.

Seiya Abe, Kazunori Hasegawa, Masanori Tsukuda, Keiji Wada, Ichiro Omura, Tamotsu Ninomiya

Microelectron. Reliab., 2017

3D scaling for insulated gate bipolar transistors (IGBTs) with low Vce(sat).

Kazuo Tsutsui, Kuniyuki Kakushima, Takuya Hoshii, A. Nakajima, Shinichi Nishizawa, Hitoshi Wakabayashi, Iriya Muneta, K. Sato, Tomoko Matsudai, Wataru Saito, Takuya Saraya, K. Itou, M. Fukui, S. Suzuki, Masaharu Kobayashi, T. Takakura, Toshiro Hiramoto, Atsushi Ogura, Y. Numasawa, Ichiro Omura, H. Ohashi, Hiroshi Iwai

Proceedings of the 12th IEEE International Conference on ASIC, 2017

2016

Design and Analysis of a New Evaluation Circuit for Capacitors Used in a High-Power Three-Phase Inverter.

Kazunori Hasegawa, Ichiro Omura, Shinichi Nishizawa

IEEE Trans. Ind. Electron., 2016

Micro PCB Rogowski coil for current monitoring and protection of high voltage power modules.

Masanori Tsukuda, Masahiro Koga, Kenta Nakashima, Ichiro Omura

Microelectron. Reliab., 2016

Temperature rise measurement for power-loss comparison of an aluminum electrolytic capacitor between sinusoidal and square-wave current injections.

Kazunori Hasegawa, Kentaro Kozuma, Kousuke Tsuzaki, Ichiro Omura, Shinichi Nishizawa

Microelectron. Reliab., 2016

Failure rate calculation method for high power devices in space applications at low earth orbit.

Erdenebaatar Dashdondog, Shohei Harada, Yuji Shiba, Ichiro Omura

Microelectron. Reliab., 2016

2015

Failure analysis of power devices based on real-time monitoring.

Akihiko Watanabe, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2015

High-throughput and full automatic DBC-module screening tester for high power IGBT.

Masanori Tsukuda, H. Tomonaga, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura

Microelectron. Reliab., 2015

16-Channel micro magnetic flux sensor array for IGBT current distribution measurement.

H. Tomonaga, Masanori Tsukuda, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura

Microelectron. Reliab., 2015

2014

Structure oriented compact model for advanced trench IGBTs without fitting parameters for extreme condition: Part II.

Junpei Takaishi, Syohei Harada, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2014

Short-circuit protection for an IGBT with detecting the gate voltage and gate charge.

Kazunori Hasegawa, Kenichi Yamamoto, Hidetaro Yoshida, Kota Hamada, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2014

2013

Real time degradation monitoring system for high power IGBT module under power cycling test.

Akihiko Watanabe, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2013

IGBT chip current imaging system by scanning local magnetic field.

Hiroaki Shiratsuchi, Kohei Matsushita, Ichiro Omura

Microelectron. Reliab., 2013

2012

Real-time failure imaging system under power stress for power semiconductors using Scanning Acoustic Tomography (SAT).

Akihiko Watanabe, Ichiro Omura

Microelectron. Reliab., 2012

2011

"Design for EMI" approach on power PiN diode reverse recovery.

Masanori Tsukuda, Keiichiro Kawakami, Kenichi Takahama, Ichiro Omura

Microelectron. Reliab., 2011

Structure oriented compact model for advanced trench IGBTs without fitting parameters for extreme condition: Part I.

Masahiro Tanaka, Ichiro Omura

Microelectron. Reliab., 2011

Tiny-scale "stealth" current sensor to probe power semiconductor device failure.

Yuya Kasho, Hidetoshi Hirai, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2011

2007

Power Semiconductor Devices for Hybrid, Electric, and Fuel Cell Vehicles.

Zheng John Shen, Ichiro Omura

Proc. IEEE, 2007