Masanori Tsukuda

According to our database, Masanori Tsukuda authored at least 15 papers between 2011 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

Switching of 3300V Scaled IGBT by 5V Gate Drive.

Toshiro Hiramoto, Katsumi Satoh, Tomoko Matsudai, Wataru Saito, Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Naoyuki Shigyo, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Atsushi Ogura, Shinichi Nishizawa, Ichiro Omura, Hiromichi Ohashi, Kazuo Itou, Toshihiro Takakura, Munetoshi Fukui, Shinichi Suzuki, Ken Takeuchi, Masanori Tsukuda, Yohichiroh Numasawa

Proceedings of the 13th IEEE International Conference on ASIC, 2019

2018

Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena.

Masanori Tsukuda, Seiya Abe, Kazunori Hasegawa, Tamotsu Ninomiya, Ichiro Omura

Microelectron. Reliab., 2018

A fully digital feedback control of gate driver for current balancing of parallel connected power devices.

Ravi N. Tripathi, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2018

Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system.

Bat-Otgon Bat-Ochir, Battuvshin Bayarkhuu, Kazunori Hasegawa, Masanori Tsukuda, Bayasgalan Dugarjav, Ichiro Omura

Microelectron. Reliab., 2018

2017

Clamp type built-in current sensor using PCB in high-voltage power modules.

Masanori Tsukuda, K. Nakashima, S. Tabata, Kazunori Hasegawa, Ichiro Omura

Microelectron. Reliab., 2017

Modelling of the shoot-through phenomenon introduced by the next generation IGBT in inverter applications.

Seiya Abe, Kazunori Hasegawa, Masanori Tsukuda, Keiji Wada, Ichiro Omura, Tamotsu Ninomiya

Microelectron. Reliab., 2017

2016

Micro PCB Rogowski coil for current monitoring and protection of high voltage power modules.

Masanori Tsukuda, Masahiro Koga, Kenta Nakashima, Ichiro Omura

Microelectron. Reliab., 2016

2015

Failure analysis of power devices based on real-time monitoring.

Akihiko Watanabe, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2015

High-throughput and full automatic DBC-module screening tester for high power IGBT.

Masanori Tsukuda, H. Tomonaga, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura

Microelectron. Reliab., 2015

16-Channel micro magnetic flux sensor array for IGBT current distribution measurement.

H. Tomonaga, Masanori Tsukuda, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura

Microelectron. Reliab., 2015

2014

Structure oriented compact model for advanced trench IGBTs without fitting parameters for extreme condition: Part II.

Junpei Takaishi, Syohei Harada, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2014

Short-circuit protection for an IGBT with detecting the gate voltage and gate charge.

Kazunori Hasegawa, Kenichi Yamamoto, Hidetaro Yoshida, Kota Hamada, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2014

2013

Real time degradation monitoring system for high power IGBT module under power cycling test.

Akihiko Watanabe, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2013

2011

"Design for EMI" approach on power PiN diode reverse recovery.

Masanori Tsukuda, Keiichiro Kawakami, Kenichi Takahama, Ichiro Omura

Microelectron. Reliab., 2011

Tiny-scale "stealth" current sensor to probe power semiconductor device failure.

Yuya Kasho, Hidetoshi Hirai, Masanori Tsukuda, Ichiro Omura

Microelectron. Reliab., 2011