João Antonio Martino

Orcid: 0000-0001-8121-6513

According to our database1, João Antonio Martino authored at least 14 papers between 2000 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2021
Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices.
Microelectron. J., 2021

2019
Tradeoff between the transistor reconfigurable technology and the zero-temperature-coefficient (ZTC) bias point on <sup>BE</sup>SOI MOSFET.
Microelectron. J., 2019

Performance evaluation of Tunnel-FET basic amplifier circuits.
Proceedings of the 10th IEEE Latin American Symposium on Circuits & Systems, 2019

2014
Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation.
Microelectron. Reliab., 2014

2012
An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices.
Microelectron. Reliab., 2012

2007
Study of the linear kink effect in PD SOI nMOSFETs.
Microelectron. J., 2007

2006
Cryogenic operation of graded-channel silicon-on-insulator nMOSFETs for high performance analog applications.
Microelectron. J., 2006

Gain improvement in operational transconductance amplifiers using Graded-Channel SOI nMOSFETS.
Microelectron. J., 2006

Evaluation of graded-channel SOI MOSFET operation at high temperatures.
Microelectron. J., 2006

The temperature mobility degradation influence on the zero temperature coefficient of partially and fully depleted SOI MOSFETs.
Microelectron. J., 2006

Impact of the twin-gate structure on the linear kink effect in PD SOI nMOSFETS.
Microelectron. J., 2006

2003
Design of Operational Transconductance Amplifiers with Improved Gain by Using Graded-Channel SOI nMOSFETs.
Proceedings of the 16th Annual Symposium on Integrated Circuits and Systems Design, 2003

2001
Analog Circuit Design Using Graded-Channel SOI NMOSFETS.
Proceedings of the 14th Annual Symposium on Integrated Circuits and Systems Design, 2001

2000
Determination of Silicon Film Thickness in SOI Capacitors.
Proceedings of the 1st Latin American Test Workshop, 2000


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