Christopher Münch

Christoph Küffner

Evi Hartmann

Comput. Ind. Eng., September, 2023

NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., May, 2023

Timing-accurate simulation framework for NVM-based compute-in-memory architecture exploration.

[BibT_eX]

[DOI]

Vincent Rietz

Mahta Mayahinia

it Inf. Technol., May, 2023

Transforming resilience in the context of a pandemic: results from a cross-industry case study exploring supply chain viability.

[BibT_eX]

[DOI]

Evi Hartmann

Int. J. Prod. Res., April, 2023

SpinDrop: Dropout-Based Bayesian Binary Neural Networks With Spintronic Implementation.

[BibT_eX]

[DOI]

IEEE J. Emerg. Sel. Topics Circuits Syst., March, 2023

Design and Test of Spintronic Compute-in-Memory Architectures

[BibT_eX]

[DOI]

Sina Bakhtavari Mamaghani

PhD thesis, 2023

A Low Overhead Checksum Technique for Error Correction in Memristive Crossbar for Deep Learning Applications.

[BibT_eX]

[DOI]

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

Smart Hammering: A practical method of pinhole detection in MRAM memories.

[BibT_eX]

[DOI]

Jongsin Yun

Martin Keim

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Automatic Test Pattern Generation and Compaction for Deep Neural Networks.

[BibT_eX]

[DOI]

Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023

2022

MBIST-based Trim-Search Test Time Reduction for STT-MRAM.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Special Session: STT-MRAMs: Technology, Design and Test.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices.

[BibT_eX]

[DOI]

Proceedings of the 17th ACM International Symposium on Nanoscale Architectures, 2022

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory.

[BibT_eX]

[DOI]

Moritz Fieback

Guilherme Cardoso Medeiros

Anteneh Gebregiorgis

Mottaqiallah Taouil

Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2022

Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2022

MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories.

[BibT_eX]

[DOI]

Proceedings of the 25th Euromicro Conference on Digital System Design, 2022

2021

Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory.

[BibT_eX]

[DOI]

Mahta Mayahinia

Proceedings of the IEEE International Test Conference, 2021

MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM.

[BibT_eX]

[DOI]

Proceedings of the 26th IEEE European Test Symposium, 2021

NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.

[BibT_eX]

[DOI]

Proceedings of the 26th IEEE European Test Symposium, 2021

Testing Resistive Memory based Neuromorphic Architectures using Reference Trimming.

[BibT_eX]

[DOI]

Sarath Mohanachandran Nair

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis.

[BibT_eX]

[DOI]

Ying Wang

Huawei Li

Said Hamdioui

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Defect Characterization of Spintronic-based Neuromorphic Circuits.

[BibT_eX]

[DOI]

Sarath Mohanachandran Nair

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2020

Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories.

[BibT_eX]

[DOI]

Rajendra Bishnoi

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019

Reliable in-memory neuromorphic computing using spintronics.

[BibT_eX]

[DOI]

Rajendra Bishnoi

Proceedings of the 24th Asia and South Pacific Design Automation Conference, 2019

2018

Multi-bit non-volatile spintronic flip-flop.

[BibT_eX]

[DOI]

Rajendra Bishnoi