Shuji Hamada

According to our database, Shuji Hamada authored at least 10 papers between 1991 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

A Statistical Quality Model for Delay Testing.

Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Seiji Kajihara

IEICE Trans. Electron., 2006

A Framework of High-quality Transition Fault ATPG for Scan Circuits.

Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato

Proceedings of the 2006 IEEE International Test Conference, 2006

Recognition of Sensitized Longest Paths in Transition Delay Test.

Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Noduyama, Yasuo Sato

Proceedings of the 2006 IEEE International Test Conference, 2006

Not all Delay Tests Are the Same - SDQL Model Shows True-Time.

Anis Uzzaman, Mick Tegethoff, Bibo Li, Kevin McCauley, Shuji Hamada, Yasuo Sato

Proceedings of the 15th Asian Test Symposium, 2006

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects.

Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo

Proceedings of the 15th Asian Test Symposium, 2006

A dynamic test compaction procedure for high-quality path delay testing.

Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato

Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, 2006

2005

Invisible delay quality - SDQM model lights up what could not be seen.

Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Nozuyama, Seiji Kajihara

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Path delay test compaction with process variation tolerance.

Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato

Proceedings of the 42nd Design Automation Conference, 2005

Evaluation of the statistical delay quality model.

Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Seiji Kajihara

Proceedings of the 2005 Conference on Asia South Pacific Design Automation, 2005

1991

Method of diagnosing multiple stuck-at-faults in combinational circuits.

Teruhiko Yamada, Shuji Hamada, Tatsuo Matsumoto, Toshihiko Takahashi, Takao Nakayama

Syst. Comput. Jpn., 1991