Luz Balado

According to our database, Luz Balado authored at least 18 papers between 2002 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Indirect and adaptive test of analogue circuits based on preselected steady-state response measures.

Álvaro Gómez-Pau, Emili Lupon, Luz Balado, Joan Figueras

IET Circuits Devices Syst., 2020

2017

Multi-Directional Space Tessellation to Improve the Decision Boundary in Indirect Mixed-Signal Testing.

Álvaro Gómez-Pau, Luz Balado, Joan Figueras

J. Electron. Test., 2017

2016

Efficient Production Binning Using Octree Tessellation in the Alternate Measurements Space.

Álvaro Gómez-Pau, Luz Balado, Joan Figueras

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Indirect test of M-S circuits using multiple specification band guarding.

Álvaro Gómez-Pau, Luz Balado, Joan Figueras

Integr., 2016

2015

Analog circuits testing using digitally coded indirect measurements.

Álvaro Gómez-Pau, Luz Balado, Joan Figueras

Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

2014

M-S specification binning based on digitally coded indirect measurements.

Álvaro Gómez-Pau, Luz Balado, Joan Figueras

Proceedings of the 19th IEEE European Test Symposium, 2014

2013

M-S test based on specification validation using octrees in the measure space.

Álvaro Gómez-Pau, Luz Balado, Joan Figueras

Proceedings of the 18th IEEE European Test Symposium, 2013

2010

Analog circuit test based on a digital signature.

Alvaro Gómez, Ricard Sanahuja, Luz Balado, Joan Figueras

Proceedings of the Design, Automation and Test in Europe, 2010

2009

Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures.

Luz Balado, Emili Lupon, Joan Figueras, Miquel Roca, Eugeni Isern, Rodrigo Picos

IEEE Trans. Circuits Syst. I Regul. Pap., 2009

2006

Lissajous Based Mixed-Signal Testing for N-Observable Signals.

Luz Balado, Emili Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

2005

Testing Biquad Filters under Parametric Shifts Using X-Y Zoning.

R. Sanahuja, Victor Barcons, Luz Balado, Joan Figueras

J. Electron. Test., 2005

2004

On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level.

Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras

J. Electron. Test., 2004

Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours.

Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras

J. Electron. Test., 2004

BIST Technique by Equally Spaced Test Vector Sequences.

Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ.

Marie-Lise Flottes, Yves Bertrand, Luz Balado, Emili Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, Nicoleta Pricopi, Hans-Joachim Wunderlich

Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004

2003

Test Engineering Education in Europe: the EuNICE-Test Project.

Yves Bertrand, Marie-Lise Flottes, Luz Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, Nicoleta Pricopi, Hans-Joachim Wunderlich, Jean-Pierre Van der Heyden

Proceedings of the 2003 International Conference on Microelectronics Systems Education, 2003

On the selection of efficient arithmetic additive test pattern generators [logic test].

Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras

Proceedings of the 8th European Test Workshop, 2003

2002

On High-Quality, Low Energy BIST Preparation at RT-Level.

Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras

Proceedings of the 3rd Latin American Test Workshop, 2002