Mahdi Benkhelifa
Orcid: 0000-0002-8982-2902
According to our database1,
Mahdi Benkhelifa
authored at least 4 papers
between 2022 and 2025.
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Bibliography
2025
Investigation of Cryogenic Aging in 28 nm CMOS: Suppression of BTI and HCD in Circuits and SRAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
Heterogeneous Integration of Advanced CMOS and Emerging Devices: Challenges and Solutions.
Proceedings of the IEEE European Test Symposium, 2025
Proceedings of the Design, Automation & Test in Europe Conference, 2025
2022
Multim. Tools Appl., 2022