Nunzio Mirabella

Orcid: 0000-0003-2315-2552

According to our database1, Nunzio Mirabella authored at least 5 papers between 2020 and 2023.

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Bibliography

2023
Targeting different defect-oriented fault models in IC testing: an experimental approach.
Proceedings of the 26th Euromicro Conference on Digital System Design, 2023

2022
Recent Trends and Perspectives on Defect-Oriented Testing.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

A comparative overview of ATPG flows targeting traditional and cell-aware fault models.
Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022

2021
Comparing different solutions for testing resistive defects in low-power SRAMs.
Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2020
On the test of single via related defects in digital VLSI designs.
Proceedings of the 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2020


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