Jhon Gomez

Orcid: 0000-0002-3676-1106

According to our database1, Jhon Gomez authored at least 10 papers between 2019 and 2023.

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Bibliography

2023
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis.
Proceedings of the IEEE European Test Symposium, 2023

2022
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Recent Trends and Perspectives on Defect-Oriented Testing.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

2020
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations.
ACM Trans. Design Autom. Electr. Syst., 2020

Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs.
Proceedings of the IEEE International Test Conference, 2020

Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics.
Proceedings of the IEEE European Test Symposium, 2020

Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing.
Proceedings of the IEEE European Test Symposium, 2020

2019
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs.
Proceedings of the IEEE International Test Conference, 2019


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