Lizhou Wu

According to our database, Lizhou Wu authored at least 32 papers between 2015 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

SparGD: A Sparse GEMM Accelerator with Dynamic Dataflow.

Bo Wang, Sheng Ma, Shengbai Luo, Lizhou Wu, Jianmin Zhang, Chunyuan Zhang, Tiejun Li

ACM Trans. Design Autom. Electr. Syst., March, 2024

2023

RHS-TRNG: A Resilient High-Speed True Random Number Generator Based on STT-MTJ Device.

Siqing Fu, Tiejun Li, Chunyuan Zhang, Hanqing Li, Sheng Ma, Jianmin Zhang, Ruiyi Zhang, Lizhou Wu

IEEE Trans. Very Large Scale Integr. Syst., October, 2023

An improved matrix split-iteration method for analyzing underground water flow.

Shuairun Zhu, Lizhou Wu, Xiaolin Song

Eng. Comput., 2023

A Hybrid Kernel Pruning Approach for Efficient and Accurate CNNs.

Xiao Yi, Bo Wang, Shengbai Luo, Tiejun Li, Lizhou Wu, Jianmin Zhang, Kenli Li, Sheng Ma

Proceedings of the Algorithms and Architectures for Parallel Processing, 2023

Optimizing the Parallelism of Communication and Computation in Distributed Training Platform.

Xiang Hou, Yuan Yuan, Sheng Ma, Rui Xu, Bo Wang, Tiejun Li, Wei Jiang, Lizhou Wu, Jianmin Zhang

Proceedings of the Algorithms and Architectures for Parallel Processing, 2023

2022

MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

IEEE Trans. Computers, 2022

Defects, Fault Modeling, and Test Development Framework for RRAMs.

Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui

ACM J. Emerg. Technol. Comput. Syst., 2022

Special Session: STT-MRAMs: Technology, Design and Test.

Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

SpacKV: A Pmem-Aware Key-Value Separation Store Based on LSM-Tree.

Xuran Ge, Ming-che Lai, Yang Liu, Lizhou Wu, Zhutao Zhuang, Yang Ou, Zhiguang Chen, Nong Xiao

Proceedings of the Network and Parallel Computing, 2022

Recent Trends and Perspectives on Defect-Oriented Testing.

Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

PM-based Persistent Key Value Stores: a Survey.

Xuran Ge, Yang Liu, Lizhou Wu, Yang Ou, Zhiguang Chen, Nong Xiao

Proceedings of the 5th International Conference on Data Science and Information Technology, 2022

2021

Hard-to-Detect Fault Analysis in FinFET SRAMs.

Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui

IEEE Trans. Very Large Scale Integr. Syst., 2021

Defect and Fault Modeling Framework for STT-MRAM Testing.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

IEEE Trans. Emerg. Top. Comput., 2021

A novel mathematical model for predicting landslide displacement.

S. H. Li, Lizhou Wu, Jinsong Huang

Soft Comput., 2021

An improved whale optimization algorithm for locating critical slip surface of slopes.

S. H. Li, X. H. Luo, Lizhou Wu

Adv. Eng. Softw., 2021

Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2021

Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

Micro-seismic source location determined by a modified objective function.

Lizhou Wu, S. H. Li, R. Q. Huang, S. Y. Wang

Eng. Comput., 2020

A novel method for locating the critical slip surface of a soil slope.

S. H. Li, Lizhou Wu, X. H. Luo

Eng. Appl. Artif. Intell., 2020

Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests.

Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui

CoRR, 2020

A new grey prediction model and its application to predicting landslide displacement.

Lizhou Wu, S. H. Li, R. Q. Huang, Qiang Xu

Appl. Soft Comput., 2020

Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis.

Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2020

Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level.

Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2020

Impact of Magnetic Coupling and Density on STT-MRAM Performance.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs.

Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Device-Aware Test: A New Test Approach Towards DPPB Level.

Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2019

Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing.

Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar

Proceedings of the 24th IEEE European Test Symposium, 2019

2018

Electrical Modeling of STT-MRAM Defects.

Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2018

2017

Gemini: A Novel Hardware and Software Implementation of High-performance PCIe SSD.

Yang Ou, Nong Xiao, Fang Liu, Zhiguang Chen, Wei Chen, Lizhou Wu

Int. J. Parallel Program., 2017

2015

Dysource: a high performance and scalable NAND flash controller architecture based on source synchronous interface.

Lizhou Wu, Nong Xiao, Fang Liu, Yimo Du, Shuo Li, Yang Ou

Proceedings of the 12th ACM International Conference on Computing Frontiers, 2015