Anthony Coyette

Orcid: 0000-0002-3221-4578

According to our database1, Anthony Coyette authored at least 24 papers between 2014 and 2023.

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Bibliography

2023
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis.
Proceedings of the IEEE European Test Symposium, 2023

2022
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Recent Trends and Perspectives on Defect-Oriented Testing.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

2020
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations.
ACM Trans. Design Autom. Electr. Syst., 2020

Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs.
Proceedings of the IEEE International Test Conference, 2020

Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics.
Proceedings of the IEEE European Test Symposium, 2020

Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing.
Proceedings of the IEEE European Test Symposium, 2020

2019
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs.
Proceedings of the IEEE International Test Conference, 2019

2018
An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes.
IEEE Des. Test, 2018

ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits.
IEEE Des. Test, 2018

Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

2017
Non-intrusive detection of defects in mixed-signal integrated circuits using light activation.
Proceedings of the IEEE International Test Conference, 2017

Automatic testing of analog ICs for latent defects using topology modification.
Proceedings of the 22nd IEEE European Test Symposium, 2017

A very low cost and highly parallel DfT method for analog and mixed-signal circuits.
Proceedings of the 22nd IEEE European Test Symposium, 2017

2016
Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization.
Integr., 2016

Effective DC fault models and testing approach for open defects in analog circuits.
Proceedings of the 2016 IEEE International Test Conference, 2016

Analog fault coverage improvement using final-test dynamic part average testing.
Proceedings of the 2016 IEEE International Test Conference, 2016

Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis.
Proceedings of the 2016 IEEE International Test Conference, 2016

2015
Automated testing of mixed-signal integrated circuits by topology modification.
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Automatic generation of autonomous built-in observability structures for analog circuits.
Proceedings of the 20th IEEE European Test Symposium, 2015

2014
Design and test of analog circuits towards sub-ppm level.
Proceedings of the 2014 International Test Conference, 2014

Optimization of analog fault coverage by exploiting defect-specific masking.
Proceedings of the 19th IEEE European Test Symposium, 2014


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