Sandro Sartoni

Orcid: 0000-0003-4609-9627

According to our database1, Sandro Sartoni authored at least 9 papers between 2020 and 2023.

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Bibliography

2023
Self-Test Library Generation for In-Field Test of Path Delay Faults.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023

Evaluating the Impact of Aging on Path-Delay Self-Test Libraries.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2022
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Recent Trends and Perspectives on Defect-Oriented Testing.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries.
Proceedings of the IEEE European Test Symposium, 2022

2021
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement.
Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

2020
In-field Functional Test of CAN Bus Controllers.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020

New Perspectives on Core In-field Path Delay Test.
Proceedings of the IEEE International Test Conference, 2020

Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs.
Proceedings of the IEEE European Test Symposium, 2020


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