Sandro Sartoni

Orcid: 0000-0003-4609-9627

According to our database1, Sandro Sartoni authored at least 9 papers between 2020 and 2023.

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Bibliography

2023
Self-Test Library Generation for In-Field Test of Path Delay Faults.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023

Evaluating the Impact of Aging on Path-Delay Self-Test Libraries.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2022
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022


Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries.
Proceedings of the IEEE European Test Symposium, 2022

2021
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement.
Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

2020
In-field Functional Test of CAN Bus Controllers.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020

New Perspectives on Core In-field Path Delay Test.
Proceedings of the IEEE International Test Conference, 2020

Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs.
Proceedings of the IEEE European Test Symposium, 2020


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