Partho Bhoumik

According to our database, Partho Bhoumik authored at least 8 papers between 2024 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Defect-Aware Built-In Self-Test and Dynamic Repair for Fan-Out Wafer-Level Packaging.

Partho Bhoumik, Chris Bailey, Krishnendu Chakrabarty

IEEE Trans. Very Large Scale Integr. Syst., March, 2026

2025

Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging.

Partho Bhoumik, Christopher Bailey, Krishnendu Chakrabarty

CoRR, March, 2025

Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging^*.

Partho Bhoumik, Christopher Bailey, Krishnendu Chakrabarty

Proceedings of the 43rd IEEE VLSI Test Symposium, 2025

SMART: Scalable and Modular Architecture for Routing-Aware Testing of Fan-out Wafer-Level Packages^*.

Partho Bhoumik, Dhruv Thapar, Arjun Chaudhuri, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2025

Fault Modeling and Testing of Chiplet-to-Chiplet Interconnects in Fan-out Wafer-Level Packaging^*.

Partho Bhoumik, Arjun Chaudhuri, Sandeep Kumar Goel, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2025

The Unlikely Hero: Nonidealities in Analog Photonic Neural Networks as Built-in Adversarial Defenders.

Haotian Lu, Ziang Yin, Partho Bhoumik, Sanmitra Banerjee, Krishnendu Chakrabarty, Jiaqi Gu

Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2024

The Unlikely Hero: Nonideality in Analog Photonic Neural Networks as Built-in Defender Against Adversarial Attacks.

Haotian Lu, Ziang Yin, Partho Bhoumik, Sanmitra Banerjee, Krishnendu Chakrabarty, Jiaqi Gu

CoRR, 2024

Testing and Fault Diagnosis for Multi-level Resistive Random-Access Memory in Monolithic 3D Integration.

Shao-Chun Hung, Partho Bhoumik, Krishnendu Chakrabarty

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024