Sandeep Kumar Goel

According to our database, Sandeep Kumar Goel authored at least 51 papers between 2000 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation.

Anshuman Chandra, Moiz Khan, Ankita Patidar, Fumiaki Takashima, Sandeep Kumar Goel, Bharath Shankaranarayanan, Vuong Nguyen, Vistrita Tyagi, Manish Arora

Proceedings of the IEEE International Test Conference, 2023

2022

Innovative Practices Track: Test of 3D ICs & Chiplets.

Sandeep Kumar Goel, Sandeep Pendharkar, Chunsheng Liu

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Challenges and Solutions for 3D Fabric: A Foundry Perspective.

Sandeep Kumar Goel

Proceedings of the ISPD 2022: International Symposium on Physical Design, Virtual Event, Canada, March 27, 2022

2020

A 7-nm 4-GHz Arm¹-Core-Based CoWoS¹ Chiplet Design for High-Performance Computing.

Mu-Shan Lin, Tze-Chiang Huang, Chien-Chun Tsai, King-Ho Tam, Kenny Cheng-Hsiang Hsieh, Ching-Fang Chen, Wen-Hung Huang, Chi-Wei Hu, Yu-Chi Chen, Sandeep Kumar Goel, Chin-Ming Fu, Stefan Rusu, Chao-Chieh Li, Sheng-Yao Yang, Mei Wong, Shu-Chun Yang, Frank Lee

IEEE J. Solid State Circuits, 2020

2019

A 7nm 4GHz Arm^®-core-based CoWoS^® Chiplet Design for High Performance Computing.

Mu-Shan Lin, Tze-Chiang Huang, Chien-Chun Tsai, King-Ho Tam, Kenny Cheng-Hsiang Hsieh, Tom Chen, Wen-Hung Huang, Jack Hu, Yu-Chi Chen, Sandeep Kumar Goel, Chin-Ming Fu, Stefan Rusu, Chao-Chieh Li, Sheng-Yao Yang, Mei Wong, Shu-Chun Yang, Frank Lee

Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019

2015

Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption.

Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen

IEEE Trans. Computers, 2015

Efficient observation-point insertion for diagnosability enhancement in digital circuits.

Zipeng Li, Sandeep Kumar Goel, Frank Lee, Krishnendu Chakrabarty

Proceedings of the 2015 IEEE International Test Conference, 2015

2014

Low-Cost Post-Bond Testing of 3-D ICs Containing a Passive Silicon Interposer Base.

Chun-Chuan Chi, Erik Jan Marinissen, Sandeep Kumar Goel, Cheng-Wen Wu

IEEE Trans. Very Large Scale Integr. Syst., 2014

Design-for-diagnosis: Your safety net in catching design errors in known good dies in CoWoS^TM/3D ICs.

Sandeep Kumar Goel, Min-Jer Wang, Saman Adham, Ashok Mehta, Frank Lee

Proceedings of the Technical Papers of 2014 International Symposium on VLSI Design, 2014

Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects.

Sandeep Kumar Goel, Narendra Devta-Prasanna

Proceedings of the Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., 2014

Circuit Topology-Based Test Pattern Generation for Small-Delay Defects.

Sandeep Kumar Goel, Krishnendu Chakrabarty

Proceedings of the Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., 2014

Small-Delay Defect Coverage Metrics.

Narendra Devta-Prasanna, Sandeep Kumar Goel

Proceedings of the Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., 2014

2013

Test and debug strategy for TSMC CoWoS™ stacking process based heterogeneous 3D IC: A silicon case study.

Sandeep Kumar Goel, Saman Adham, Min-Jer Wang, Ji-Jan Chen, Tze-Chiang Huang, Ashok Mehta, Frank Lee, Vivek Chickermane, Brion L. Keller, Thomas Valind, Subhasish Mukherjee, Navdeep Sood, Jeongho Cho, Hayden Hyungdong Lee, Jungi Choi, Sangdoo Kim

Proceedings of the 2013 IEEE International Test Conference, 2013

2012

DfT architecture and ATPG for Interconnect tests of JEDEC Wide-I/O memory-on-logic die stacks.

Sergej Deutsch, Brion L. Keller, Vivek Chickermane, Subhasish Mukherjee, Navdeep Sood, Sandeep Kumar Goel, Ji-Jan Chen, Ashok Mehta, Frank Lee, Erik Jan Marinissen

Proceedings of the 2012 IEEE International Test Conference, 2012

Test challenges in designing complex 3D chips: What in on the horizon for EDA industry?: Designer track.

Sandeep Kumar Goel

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

EDA solutions to new-defect detection in advanced process technologies.

Erik Jan Marinissen, Gilbert Vandling, Sandeep Kumar Goel, Friedrich Hapke, Jason Rivers, Nikolaus Mittermaier, Swapnil Bahl

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

Test-Architecture Optimization and Test Scheduling for TSV-Based 3-D Stacked ICs.

Brandon Noia, Krishnendu Chakrabarty, Sandeep Kumar Goel, Erik Jan Marinissen, Jouke Verbree

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Post-bond testing of 2.5D-SICs and 3D-SICs containing a passive silicon interposer base.

Chun-Chuan Chi, Erik Jan Marinissen, Sandeep Kumar Goel, Cheng-Wen Wu

Proceedings of the 2011 IEEE International Test Conference, 2011

DfT Architecture for 3D-SICs with Multiple Towers.

Chun-Chuan Chi, Erik Jan Marinissen, Sandeep Kumar Goel, Cheng-Wen Wu

Proceedings of the 16th European Test Symposium, 2011

Automation of 3D-DfT Insertion.

Sergej Deutsch, Vivek Chickermane, Brion L. Keller, Subhasish Mukherjee, Mario Konijnenburg, Erik Jan Marinissen, Sandeep Kumar Goel

Proceedings of the 20th IEEE Asian Test Symposium, 2011

Multi-visit TAMs to Reduce the Post-Bond Test Length of 2.5D-SICs with a Passive Silicon Interposer Base.

Chun-Chuan Chi, Erik Jan Marinissen, Sandeep Kumar Goel, Cheng-Wen Wu

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Test-architecture optimization for TSV-based 3D stacked ICs.

Brandon Noia, Sandeep Kumar Goel, Krishnendu Chakrabarty, Erik Jan Marinissen, Jouke Verbree

Proceedings of the 15th European Test Symposium, 2010

Circuit Topology-Based Test Pattern Generation for Small-Delay Defects.

Sandeep Kumar Goel, Krishnendu Chakrabarty, Mahmut Yilmaz, Ke Peng, Mohammad Tehranipoor

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Testing of SoCs with Hierarchical Cores: Common Fallacies, Test Access Optimization, and Test Scheduling.

Sandeep Kumar Goel, Erik Jan Marinissen, Anuja Sehgal, Krishnendu Chakrabarty

IEEE Trans. Computers, 2009

Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study.

Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Effective and Efficient Test Pattern Generation for Small Delay Defect.

Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study.

Sandeep Kumar Goel, Narendra Devta-Prasanna, Mark Ward

Proceedings of the 2009 IEEE International Test Conference, 2009

Accurate measurement of small delay defect coverage of test patterns.

Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy

Proceedings of the 2009 IEEE International Test Conference, 2009

2007

Efficient testing and diagnosis of faulty power switches in SOCs.

Sandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez

IET Comput. Digit. Tech., 2007

2006

Testing and Diagnosis of Power Switches in SOCs.

Sandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez

Proceedings of the 11th European Test Symposium, 2006

Hierarchy-aware and area-efficient test infrastructure design for core-based system chips.

Anuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty

Proceedings of the Conference on Design, Automation and Test in Europe, 2006

Fault detection and diagnosis with parity trees for space compaction of test responses.

Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke

Proceedings of the 43rd Design Automation Conference, 2006

2005

Test scheduling for modular SOCs in an abort-on-fail environment.

Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen

Proceedings of the 10th European Test Symposium, 2005

On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips.

Sandeep Kumar Goel, Erik Jan Marinissen

Proceedings of the 2005 Design, 2005

2004

IEEE P1500-Compliant Test Wrapper Design for Hierarchical Cores.

Anuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

User-constrained test architecture design for modular SOC testing.

Ludovic A. Krundel, Sandeep Kumar Goel, Erik Jan Marinissen, Marie-Lise Flottes, Bruno Rouzeyre

Proceedings of the 9th European Test Symposium, 2004

Test Infrastructure Design for the Nexperia? Home Platform PNX8550 System Chip.

Sandeep Kumar Goel, Kuoshu Chiu, Erik Jan Marinissen, Toan Nguyen, Steven Oostdijk

Proceedings of the 2004 Design, 2004

Automatic generation of breakpoint hardware for silicon debug.

Bart Vermeulen, Mohammad Zalfany Urfianto, Sandeep Kumar Goel

Proceedings of the 41th Design Automation Conference, 2004

2003

SOC test architecture design for efficient utilization of test bandwidth.

Sandeep Kumar Goel, Erik Jan Marinissen

ACM Trans. Design Autom. Electr. Syst., 2003

Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips.

Sandeep Kumar Goel, Bart Vermeulen

J. Electron. Test., 2003

A Test Time Reduction Algorithm for Test Architecture Design for Core-Based System Chips.

Sandeep Kumar Goel, Erik Jan Marinissen

J. Electron. Test., 2003

Control-aware test architecture design for modular SOC testing.

Sandeep Kumar Goel, Erik Jan Marinissen

Proceedings of the 8th European Test Workshop, 2003

Layout-Driven SOC Test Architecture Design for Test Time and Wire Length Minimization.

Sandeep Kumar Goel, Erik Jan Marinissen

Proceedings of the 2003 Design, 2003

2002

Design for Debug: Catching Design Errors in Digital Chips.

Bart Vermeulen, Sandeep Kumar Goel

IEEE Des. Test Comput., 2002

Cluster-Based Test Architecture Design for System-on-Chip.

Sandeep Kumar Goel, Erik Jan Marinissen

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Core-Based Scan Architecture for Silicon Debug.

Bart Vermeulen, Tom Waayers, Sandeep Kumar Goel

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Test Resource Optimization for Multi-Site Testing of SOCs Under ATE Memory Depth Constraints.

Vikram Iyengar, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Hierarchical Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips.

Sandeep Kumar Goel, Bart Vermeulen

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Effective and Efficient Test Architecture Design for SOCs.

Sandeep Kumar Goel, Erik Jan Marinissen

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

A novel test time reduction algorithm for test architecture design for core-based system chips.

Sandeep Kumar Goel, Erik Jan Marinissen

Proceedings of the 7th European Test Workshop, 2002

2000

Wrapper design for embedded core test.

Yervant Zorian, Erik Jan Marinissen, Maurice Lousberg, Sandeep Kumar Goel

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000