Paul G. Ryan

According to our database, Paul G. Ryan authored at least 9 papers between 1990 and 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2014

Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players?

Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Process defect trends and strategic test gaps.

Paul G. Ryan, Irfan Aziz, William B. Howell, Teresa K. Janczak, Davia J. Lu

Proceedings of the 2014 International Test Conference, 2014

2003

Delay Defect Characteristics and Testing Strategies.

Kee Sup Kim, Subhasish Mitra, Paul G. Ryan

IEEE Des. Test Comput., 2003

1998

Dynamic fault dictionaries and two-stage fault isolation.

Paul G. Ryan, W. Kent Fuchs

IEEE Trans. Very Large Scale Integr. Syst., 1998

1997

Logical Diagnosis Solutions Must Drive Yield Improvement.

Paul G. Ryan

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1993

Fault dictionary compression and equivalence class computation for sequential circuits.

Paul G. Ryan, W. Kent Fuchs, Irith Pomeranz

Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

1991

Automated diagnosis of VLSI failures.

Paul G. Ryan, Shishpal Rawat, W. Kent Fuchs

Proceedings of the 9th IEEE VLSI Test Symposium (VTS'91), 1991

Two-Stage Fault Location.

Paul G. Ryan, Shishpal Rawat, W. Kent Fuchs

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Partial Detectability Profiles.

Paul G. Ryan, W. Kent Fuchs

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 1990