Prasanth Viswanathan Pillai
Orcid: 0000-0002-3625-0795Affiliations:
- Texas Instruments (India), Bangalore, India
- Indian Institute of Science, Bangalore, India (PhD 2020)
According to our database1,
Prasanth Viswanathan Pillai
authored at least 15 papers
between 2008 and 2025.
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Bibliography
2025
Advancing Functional Safety: Improving Failure Mode Analysis and Fault Injection Using Automation and GNN Algorithms.
Proceedings of the 38th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems, 2025
Proceedings of the 38th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems, 2025
Enhancing AMS Circuit Reliability: An Anomaly Dataset for Functional Safety Research in Automotive SoCs.
Proceedings of the Great Lakes Symposium on VLSI 2025, GLSVLSI 2025, New Orleans, LA, USA, 30 June 2025, 2025
2024
Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning.
CoRR, 2024
Graph Learning-based Fault Criticality Analysis for Enhancing Functional Safety of E/E Systems.
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024
2021
Proceedings of the IEEE International Test Conference, 2021
2020
Proceedings of the 46th Annual Conference of the IEEE Industrial Electronics Society, 2020
2019
Perturbation Based Workload Augmentation for Comprehensive Functional Safety Analysis.
Proceedings of the 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems, 2019
2017
Proceedings of the IEEE International Test Conference, 2017
Proceedings of the IEEE International Test Conference, 2017
2015
Proceedings of the 24th IEEE Asian Test Symposium, 2015
2012
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
2011
Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011
2010
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010
2008
DFT Implementationis for Striking the Right Balance between Test Cost and Test Quality for Automotive SOCs.
Proceedings of the 2008 IEEE International Test Conference, 2008