Rajesh Pendurkar

According to our database, Rajesh Pendurkar authored at least 9 papers between 1996 and 2008.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of two.

2008

DFX of a 3^rd Generation, 16-core/32-thread UltraSPARC- CMT Microprocessor.

Ishwar Parulkar, Sriram Anandakumar, Gaurav Agarwal, Gordon Liu, Krishna Rajan, Frank Chiu, Rajesh Pendurkar

Proceedings of the 2008 IEEE International Test Conference, 2008

2004

Distributed Diagnosis of Interconnections in SoC and MCM Designs.

Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian

J. Electron. Test., 2004

2002

A Scalable, Low Cost Design-for-Test Architecture for UltraSPARC^TM Chip Multi-Processors.

Ishwar Parulkar, Thomas A. Ziaja, Rajesh Pendurkar, Anand D'Souza, Amitava Majumdar

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Switching activity generation with automated BIST synthesis forperformance testing of interconnects.

Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2001

2000

CA-BIST for Asynchronous Circuits: A Case Study on the RAPPID Asynchronous Instruction Length Decoder.

Marly Roncken, Ken S. Stevens, Rajesh Pendurkar, Shai Rotem, Parimal Pal Chaudhuri

Proceedings of the 6th International Symposium on Advanced Research in Asynchronous Circuits and Systems (ASYNC 2000), 2000

1999

Single-probe traversal optimization for testing of MCM substrate interconnections.

Rajesh Pendurkar, Craig A. Tovey, Abhijit Chatterjee

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

1998

A distributed BIST technique for diagnosis of MCM interconnections.

Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Synthesis of BIST hardware for performance testing of MCM interconnections.

Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian

Proceedings of the 1998 IEEE/ACM International Conference on Computer-Aided Design, 1998

1996

Optimal single probe traversal algorithm for testing of MCM substrat.

Rajesh Pendurkar, Abhijit Chatterjee, Craig A. Tovey

Proceedings of the 1996 International Conference on Computer Design (ICCD '96), 1996