Renjian Pan

According to our database, Renjian Pan authored at least 10 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems.

Renjian Pan, Xin Li, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., February, 2023

2022

Unsupervised Two-Stage Root-Cause Analysis for Integrated Systems.

Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems.

Renjian Pan, Xin Li, Krishnendu Chakrabarty

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2021

Applying Machine Learning to Testing and Diagnosis of Integrated Systems.

Renjian Pan

PhD thesis, 2021

Black-Box Test-Cost Reduction Based on Bayesian Network Models.

Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems.

Renjian Pan, Xin Li, Krishnendu Chakrabarty

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

2020

Analog/RF Post-silicon Tuning via Bayesian Optimization.

Renjian Pan, Jun Tao, Yangfeng Su, Dian Zhou, Xuan Zeng, Xin Li

ACM Trans. Design Autom. Electr. Syst., 2020

Fine-grained Adaptive Testing Based on Quality Prediction.

Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu

ACM Trans. Design Autom. Electr. Syst., 2020

Unsupervised Root-Cause Analysis for Integrated Systems.

Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the IEEE International Test Conference, 2020

2019

Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model.

Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the 37th IEEE VLSI Test Symposium, 2019