Zhaobo Zhang
Orcid: 0000-0003-3449-796X
According to our database1,
Zhaobo Zhang
authored at least 60 papers
between 2009 and 2024.
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Bibliography
2024
Visual analysis method for unmanned pumping stations on dynamic platforms based on data fusion technology.
EURASIP J. Adv. Signal Process., December, 2024
Inverter With Paralleled Modules to Extend Current Capacity and Combat Motor Overvoltage in SiC-Based Adjustable Speed Drives.
IEEE Trans. Ind. Electron., May, 2024
2023
Sensors, February, 2023
Improving Entity Linking in Chinese Domain by Sense Embedding Based on Graph Clustering.
J. Comput. Sci. Technol., February, 2023
PolarisProfiler: A Novel Metadata-Based Profiling Approach for Optimizing Resource Management in the Edge-Cloud Continnum.
Proceedings of the IEEE International Conference on Service-Oriented System Engineering, 2023
Proceedings of the Machine Learning and Knowledge Discovery in Databases: Research Track, 2023
Proceedings of the 23rd IEEE/ACM International Symposium on Cluster, 2023
Proceedings of the 16th IEEE International Conference on Cloud Computing, 2023
2022
A - °C-125 °C 0.4-μA Low-Noise Bandgap Voltage Reference With 0.8-mA Load Driving Capability Using Shared Feedback Resistors.
IEEE Trans. Circuits Syst. II Express Briefs, 2022
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
IEEE Trans. Big Data, 2022
Proceedings of the 15th IEEE/ACM International Conference on Utility and Cloud Computing, 2022
Learning Chinese Word Embeddings By Discovering Inherent Semantic Relevance in Sub-characters.
Proceedings of the 31st ACM International Conference on Information & Knowledge Management, 2022
2021
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021
A High-Efficiency Dual-Antenna RF Energy Harvesting System Using Full-Energy Extraction With Improved Input Power Response.
IEEE Open J. Circuits Syst., 2021
A -40-125 °C, 0.8 V, 33 kHz relaxation oscillator with integrated voltage and current reference and compensated comparator delay.
Microelectron. J., 2021
A 5.72-μW, 1.02-MHz, -40~125°C, 1μs-Startup Time Relaxation Oscillation with Fully-on-Chip Voltage Reference and LDO Regulator.
Proceedings of the 2021 IEEE International Conference on Integrated Circuits, 2021
2020
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Hierarchical Symbol-Based Health-Status Analysis Using Time-Series Data in a Core Router System.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
KF-KNN: Low-Cost and High-Accurate FM-Based Indoor Localization Model via Fingerprint Technology.
IEEE Access, 2020
Proceedings of the IEEE International Test Conference, 2020
Proceedings of the 28th IEEE International Conference on Network Protocols, 2020
2019
Changepoint-Based Anomaly Detection for Prognostic Diagnosis in a Core Router System.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019
IEEE Des. Test, 2019
Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
2018
Toward Predictive Fault Tolerance in a Core-Router System: Anomaly Detection Using Correlation-Based Time-Series Analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018
Proceedings of the 36th IEEE VLSI Test Symposium, 2018
Proceedings of the IEEE International Test Conference, 2018
Proceedings of the International Conference on Computer-Aided Design, 2018
2017
Proceedings of the IEEE International Test Conference, 2017
Proceedings of the IEEE International Test Conference, 2017
Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification.
Proceedings of the 22nd IEEE European Test Symposium, 2017
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017
2016
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016
Accurate anomaly detection using correlation-based time-series analysis in a core router system.
Proceedings of the 2016 IEEE International Test Conference, 2016
2015
Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015
Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015
Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015
2014
Static Power Reduction Using Variation-Tolerant and Reconfigurable Multi-Mode Power Switches.
IEEE Trans. Very Large Scale Integr. Syst., 2014
Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014
Information-Theoretic Framework for Evaluating and Guiding Board-Level Functional-Fault Diagnosis.
IEEE Des. Test, 2014
Knowledge discovery and knowledge transfer in board-level functional fault diagnosis.
Proceedings of the 2014 International Test Conference, 2014
2013
Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013
AgentDiag: An agent-assisted diagnostic framework for board-level functional failures.
Proceedings of the 2013 IEEE International Test Conference, 2013
Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis.
Proceedings of the 18th IEEE European Test Symposium, 2013
Proceedings of the 22nd Asian Test Symposium, 2013
2012
IEEE Trans. Very Large Scale Integr. Syst., 2012
Diagnostic system based on support-vector machines for board-level functional diagnosis.
Proceedings of the 17th IEEE European Test Symposium, 2012
Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines.
Proceedings of the 21st IEEE Asian Test Symposium, 2012
Proceedings of the 21st IEEE Asian Test Symposium, 2012
2011
Proceedings of the VLSI Design 2011: 24th International Conference on VLSI Design, 2011
Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks.
Proceedings of the 2011 IEEE International Test Conference, 2011
Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011
Proceedings of the 16th European Test Symposium, 2011
2010
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
Proceedings of the 2011 IEEE International Test Conference, 2010
Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test.
Proceedings of the 19th IEEE Asian Test Symposium, 2010
2009
Proceedings of the 2009 IEEE International Test Conference, 2009