Xin Li

ACM Trans. Cyber Phys. Syst., April, 2023

Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., February, 2023

Correlated Bayesian Model Fusion: Efficient High-Dimensional Performance Modeling of Analog/RF Integrated Circuits Over Multiple Corners.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., February, 2023

2022

Correlated Rare Failure Analysis via Asymptotic Probability Evaluation.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Unsupervised Two-Stage Root-Cause Analysis for Integrated Systems.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Knowledge Transfer in Board-Level Functional Fault Diagnosis Enabled by Domain Adaptation.

[BibT_eX]

[DOI]

Mengyun Liu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Fast Statistical Analysis of Rare Failure Events With Truncated Normal Distribution in High-Dimensional Variation Space.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2021

Guest Editorial: Cloud-Edge Computing for Cyber-Physical Systems and Internet of Things.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Informatics, 2021

A Survey on Edge and Edge-Cloud Computing Assisted Cyber-Physical Systems.

[BibT_eX]

[DOI]

Kun Cao

Shiyan Hu

Yang Shi

Armando Walter Colombo

Stamatis Karnouskos

IEEE Trans. Ind. Informatics, 2021

Black-Box Test-Cost Reduction Based on Bayesian Network Models.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Board-Level Functional Fault Identification Using Streaming Data.

[BibT_eX]

[DOI]

Mengyun Liu

Fangming Ye

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Facial Expression Recognition with Identity and Emotion Joint Learning.

[BibT_eX]

[DOI]

IEEE Trans. Affect. Comput., 2021

Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems.

[BibT_eX]

[DOI]

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Robust Classification with Noisy Labels for Manufacturing Applications: A Hybrid Approach Based on Active Learning and Data Cleaning.

[BibT_eX]

[DOI]

Shuo Zhao

Ying-Chi Chen

Proceedings of the IECON 2021, 2021

2020

Analog/RF Post-silicon Tuning via Bayesian Optimization.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2020

Fine-grained Adaptive Testing Based on Quality Prediction.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2020

Bi-Modality Medical Image Synthesis Using Semi-Supervised Sequential Generative Adversarial Networks.

[BibT_eX]

[DOI]

IEEE J. Biomed. Health Informatics, 2020

Partial Bayesian Co-training for Virtual Metrology.

[BibT_eX]

[DOI]

Cuong Manh Nguyen

Ronald DeShawn Blanton

Xiang Li

IEEE Trans. Ind. Informatics, 2020

Efficient Statistical Analysis for Correlated Rare Failure Events via Asymptotic Probability Approximation.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Efficient Rare Failure Analysis Over Multiple Corners via Correlated Bayesian Inference.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Big Data for Cyber-Physical Systems.

[BibT_eX]

[DOI]

IEEE Trans. Big Data, 2020

Towards Latency-aware DNN Optimization with GPU Runtime Analysis and Tail Effect Elimination.

[BibT_eX]

[DOI]

Dimitrios Lymberopoulos

CoRR, 2020

Multi-phase and Multi-level Selective Feature Fusion for Automated Pancreas Segmentation from CT Images.

[BibT_eX]

[DOI]

Proceedings of the Medical Image Computing and Computer Assisted Intervention - MICCAI 2020, 2020

Unsupervised Root-Cause Analysis for Integrated Systems.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2020

Exploring Inter-Sensor Correlation for Missing Data Estimation.

[BibT_eX]

[DOI]

Proceedings of the 46th Annual Conference of the IEEE Industrial Electronics Society, 2020

A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications.

[BibT_eX]

[DOI]

Shuo Zhao

Ying-Chi Chen

Proceedings of the 25th IEEE International Conference on Emerging Technologies and Factory Automation, 2020

Efficient Classification via Partial Co-Training for Virtual Metrology.

[BibT_eX]

[DOI]

Proceedings of the 25th IEEE International Conference on Emerging Technologies and Factory Automation, 2020

2019

Cross-Scale Predictive Dictionaries.

[BibT_eX]

[DOI]

Vishwanath Saragadam

IEEE Trans. Image Process., 2019

Dependable Visual Light-Based Indoor Localization with Automatic Anomaly Detection for Location-Based Service of Mobile Cyber-Physical Systems.

[BibT_eX]

[DOI]

ACM Trans. Cyber Phys. Syst., 2019

Graph-Constrained Sparse Performance Modeling for Analog Circuit Optimization via SDP Relaxation.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

Guest Editors' Introduction: Hardware and Algorithms for Energy-Constrained On-Chip Machine Learning (Part 2).

[BibT_eX]

[DOI]

ACM J. Emerg. Technol. Comput. Syst., 2019

Guest Editors' Introduction to the Special Section on Hardware and Algorithms for Energy-Constrained On-chip Machine Learning.

[BibT_eX]

[DOI]

ACM J. Emerg. Technol. Comput. Syst., 2019

Computer vision algorithms and hardware implementations: A survey.

[BibT_eX]

[DOI]

Integr., 2019

Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model.

[BibT_eX]

[DOI]

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Knowledge Transfer in Board-Level Functional Fault Identification using Domain Adaptation.

[BibT_eX]

[DOI]

Mengyun Liu

Proceedings of the IEEE International Test Conference, 2019

2018

Improving Diagnostic Resolution of Failing ICs Through Learning.

[BibT_eX]

[DOI]

Yang Xue

Ronald D. Blanton

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Guest Editorial Circuit and System Design Automation for Internet of Things.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Efficient Hierarchical Performance Modeling for Analog and Mixed-Signal Circuits via Bayesian Co-Learning.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning.

[BibT_eX]

[DOI]

Alberto L. Sangiovanni-Vincentelli

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Design Automation for Cyber-Physical Systems [Scanning the Issue].

[BibT_eX]

[DOI]

Qi Zhu

Shiyan Hu

Proc. IEEE, 2018

Guest Editors' Introduction: Frontiers of Hardware and Algorithms for On-chip Learning.

[BibT_eX]

[DOI]

ACM J. Emerg. Technol. Comput. Syst., 2018

Environment-Adaptable Fast Multi-Resolution (EAF-MR) optimization in large-scale RF-FPGA systems.

[BibT_eX]

[DOI]

Minhee Jun

Rohit Negi

Shihui Yin

EURASIP J. Wirel. Commun. Netw., 2018

Model-based and data-driven approaches for building automation and control.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Computer-Aided Design, 2018

Predictive Modeling for Advanced Virtual Metrology: A Tree-Based Approach.

[BibT_eX]

[DOI]

Yang Liu

Proceedings of the 23rd IEEE International Conference on Emerging Technologies and Factory Automation, 2018

Single-Channel Real-Time Drowsiness Detection Based on Electroencephalography.

[BibT_eX]

[DOI]

Hassan Albalawi

Proceedings of the 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2018

Intelligent corner synthesis via cycle-consistent generative adversarial networks for efficient validation of autonomous driving systems.

[BibT_eX]

[DOI]

Handi Yu

Proceedings of the 23rd Asia and South Pacific Design Automation Conference, 2018

2017

High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2017

An FPGA-Based Hardware Accelerator for Traffic Sign Detection.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2017

Training Fixed-Point Classifiers for On-Chip Low-Power Implementation.

[BibT_eX]

[DOI]

Hassan Albalawi

Yuanning Li

ACM Trans. Design Autom. Electr. Syst., 2017

Guest Editorial: Special Issue on Smart Homes, Buildings and Infrastructures.

[BibT_eX]

[DOI]

Shiyan Hu

Qi Zhu

ACM Trans. Cyber Phys. Syst., 2017

C-YES: An Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multicorner-Multiperformance Correlations.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Machine Learning for Noise Sensor Placement and Full-Chip Voltage Emergency Detection.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

DFM Evaluation Using IC Diagnosis Data.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Data-Driven Sampling Matrix Boolean Optimization for Energy-Efficient Biomedical Signal Acquisition by Compressive Sensing.

[BibT_eX]

[DOI]

IEEE Trans. Biomed. Circuits Syst., 2017

Guest Editors' Introduction: Hardware and Algorithms for On-Chip Learning.

[BibT_eX]

[DOI]

ACM J. Emerg. Technol. Comput. Syst., 2017

Algorithm and hardware implementation for visual perception system in autonomous vehicle: A survey.

[BibT_eX]

[DOI]

Weijing Shi

Huafeng Yu

Integr., 2017

Guest Editorial.

[BibT_eX]

[DOI]

IET Cyper-Phys. Syst.: Theory & Appl., 2017

Aggregated Load and Generation Equivalent Circuit Models with Semi-Empirical Data Fitting.

[BibT_eX]

[DOI]

CoRR, 2017

Compressive spectral anomaly detection.

[BibT_eX]

[DOI]

Vishwanath Saragadam

Jian Wang

Proceedings of the 2017 IEEE International Conference on Computational Photography, 2017

Impact of circuit-level non-idealities on vision-based autonomous driving systems.

[BibT_eX]

[DOI]

Proceedings of the 2017 IEEE/ACM International Conference on Computer-Aided Design, 2017

Efficient programming of reconfigurable radio frequency (RF) systems.

[BibT_eX]

[DOI]

Proceedings of the 2017 IEEE/ACM International Conference on Computer-Aided Design, 2017

Partial co-training for virtual metrology.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE International Conference on Emerging Technologies and Factory Automation, 2017

Efficient Hierarchical Performance Modeling for Integrated Circuits via Bayesian Co-Learning.

[BibT_eX]

[DOI]

Mohamad Baker Alawieh

Proceedings of the 54th Annual Design Automation Conference, 2017

Session 13 - Security circuits and systems.

[BibT_eX]

[DOI]

Swaroop Ghosh

Proceedings of the 2017 IEEE Custom Integrated Circuits Conference, 2017

2016

Distributed MPC for Efficient Coordination of Storage and Renewable Energy Sources Across Control Areas.

[BibT_eX]

[DOI]

IEEE Trans. Smart Grid, 2016

Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2016

Parasitic-Aware Common-Centroid FinFET Placement and Routing for Current-Ratio Matching.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2016

Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Harvesting Design Knowledge From the Internet: High-Dimensional Performance Tradeoff Modeling for Large-Scale Analog Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Efficient Spatial Variation Modeling of Nanoscale Integrated Circuits Via Hidden Markov Tree.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Efficient Hybrid Performance Modeling for Analog Circuits Using Hierarchical Shrinkage Priors.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Modeling Random Telegraph Noise as a Randomness Source and its Application in True Random Number Generation.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Decoding Brain States Based on Magnetoencephalography From Prespecified Cortical Regions.

[BibT_eX]

[DOI]

Jennifer L. Collinger

Douglas J. Weber

Anto Bagic

IEEE Trans. Biomed. Eng., 2016

Energy-Constrained Distributed Learning and Classification by Exploiting Relative Relevance of Sensors' Data.

[BibT_eX]

[DOI]

IEEE J. Sel. Areas Commun., 2016

Editorial: Special Issue on The 14th International Conference on Computer-Aided Design and Computer Graphics (CAD/Graphics 2015).

[BibT_eX]

[DOI]

Sheldon X.-D. Tan

Yu Wang

Integr., 2016

Guest Editorial Emerging Memories - Technology, Architecture and Applications (Second Issue).

[BibT_eX]

[DOI]

IEEE J. Emerg. Sel. Topics Circuits Syst., 2016

Guest Editorial Emerging Memories - Technology, Architecture and Applications (First Issue).

[BibT_eX]

[DOI]

IEEE J. Emerg. Sel. Topics Circuits Syst., 2016

Overview of Circuits, Systems, and Applications of Spintronics.

[BibT_eX]

[DOI]

Swaroop Ghosh

Anirudh Iyengar

Seyedhamidreza Motaman

IEEE J. Emerg. Sel. Topics Circuits Syst., 2016

Guest Editors' Introduction Challenges and Opportunities in Analog/Mixed-Signal CAD.

[BibT_eX]

[DOI]

Chandramouli V. Kashyap

Chris J. Myers

IEEE Des. Test, 2016

Preface.

[BibT_eX]

[DOI]

Comput. Graph., 2016

Diagnostic resolution improvement through learning-guided physical failure analysis.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE International Test Conference, 2016

Efficient analog circuit optimization using sparse regression and error margining.

[BibT_eX]

[DOI]

Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

Steady-state analysis of power system harmonics using equivalent split-circuit models.

[BibT_eX]

[DOI]

Proceedings of the IEEE PES Innovative Smart Grid Technologies Conference Europe, 2016

Unified power system analyses and models using equivalent circuit formulation.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE Power & Energy Society Innovative Smart Grid Technologies Conference, 2016

Virtual temperature measurement for smart buildings via Bayesian model fusion.

[BibT_eX]

[DOI]

Xiaoming Chen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

Identifying systematic spatial failure patterns through wafer clustering.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

Overview of cyber-physical temperature estimation in smart buildings: From modeling to measurements.

[BibT_eX]

[DOI]

Xiaoming Chen

Sheldon X.-D. Tan

Proceedings of the IEEE Conference on Computer Communications Workshops, 2016

Cross-scale predictive dictionaries for image and video restoration.

[BibT_eX]

[DOI]

Vishwanath Saragadam

Proceedings of the 2016 IEEE International Conference on Image Processing, 2016

Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation.

[BibT_eX]

[DOI]

Proceedings of the 35th International Conference on Computer-Aided Design, 2016

Efficient statistical validation of machine learning systems for autonomous driving.

[BibT_eX]

[DOI]

Weijing Shi

Proceedings of the 35th International Conference on Computer-Aided Design, 2016

Efficient spatial variation modeling via robust dictionary learning.

[BibT_eX]

[DOI]

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Correlated Bayesian Model Fusion: efficient performance modeling of large-scale tunable analog/RF integrated circuits.

[BibT_eX]

[DOI]

Proceedings of the 53rd Annual Design Automation Conference, 2016

Efficient performance modeling via Dual-Prior Bayesian Model Fusion for analog and mixed-signal circuits.

[BibT_eX]

[DOI]

Proceedings of the 53rd Annual Design Automation Conference, 2016

Efficient performance modeling of analog integrated circuits via kernel density based sparse regression.

[BibT_eX]

[DOI]

Proceedings of the 53rd Annual Design Automation Conference, 2016

Energy efficient learning and classification for distributed sensing.

[BibT_eX]

[DOI]

Christy Li

Pulkit Grover

Proceedings of the 8th International Conference on Communication Systems and Networks, 2016

Re-thinking polynomial optimization: Efficient programming of reconfigurable radio frequency (RF) systems by convexification.

[BibT_eX]

[DOI]

Proceedings of the 21st Asia and South Pacific Design Automation Conference, 2016

Thermal modeling for energy-efficient smart building with advanced overfitting mitigation technique.

[BibT_eX]

[DOI]

Proceedings of the 21st Asia and South Pacific Design Automation Conference, 2016

2015

Efficient Transient Analysis of Power Delivery Network With Clock/Power Gating by Sparse Approximation.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

A Novel Analog Physical Synthesis Methodology Integrating Existent Design Expertise.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Statistical rare event analysis using smart sampling and parameter guidance.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE International System-on-Chip Conference, 2015

Common-Centroid FinFET Placement Considering the Impact of Gate Misalignment.

[BibT_eX]

[DOI]

Proceedings of the 2015 Symposium on International Symposium on Physical Design, ISPD 2015, Monterey, CA, USA, March 29, 2015

Optimizing Boolean embedding matrix for compressive sensing in RRAM crossbar.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Symposium on Low Power Electronics and Design, 2015

Learning Based Compact Thermal Modeling for Energy-Efficient Smart Building Management: (invited).

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

Co-Learning Bayesian Model Fusion: Efficient Performance Modeling of Analog and Mixed-Signal Circuits Using Side Information.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

From Robust Chip to Smart Building: CAD Algorithms and Methodologies for Uncertainty Analysis of Building Performance.

[BibT_eX]

[DOI]

Xiaoming Chen

Sheldon X.-D. Tan

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

Statistical Learning in Chip (SLIC).

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

EDA Challenges for Memristor-Crossbar based Neuromorphic Computing.

[BibT_eX]

[DOI]

Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20, 2015

Phase Noise Impairment and Environment-Adaptable Fast (EAF) Optimization for Programming of Reconfigurable Radio Frequency (RF) Receivers.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE Global Communications Conference, 2015

A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits.

[BibT_eX]

[DOI]

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

Efficient bit error rate estimation for high-speed link by Bayesian model fusion.

[BibT_eX]

[DOI]

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

mTunes: efficient post-silicon tuning of mixed-signal/RF integrated circuits based on Markov decision process.

[BibT_eX]

[DOI]

Proceedings of the 52nd Annual Design Automation Conference, 2015

An EDA framework for large scale hybrid neuromorphic computing systems.

[BibT_eX]

[DOI]

Proceedings of the 52nd Annual Design Automation Conference, 2015

A statistical methodology for noise sensor placement and full-chip voltage map generation.

[BibT_eX]

[DOI]

Proceedings of the 52nd Annual Design Automation Conference, 2015

Vortex: variation-aware training for memristor X-bar.

[BibT_eX]

[DOI]

Proceedings of the 52nd Annual Design Automation Conference, 2015

Efficient multivariate moment estimation via Bayesian model fusion for analog and mixed-signal circuits.

[BibT_eX]

[DOI]

Proceedings of the 52nd Annual Design Automation Conference, 2015

Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE Custom Integrated Circuits Conference, 2015

Accurate passivity-enforced macromodeling for RF circuits via iterative zero/pole update based on measurement data.

[BibT_eX]

[DOI]

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space.

[BibT_eX]

[DOI]

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

SIPredict: Efficient post-layout waveform prediction via System Identification.

[BibT_eX]

[DOI]

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

2014

Indirect Performance Sensing for On-Chip Self-Healing of Analog and RF Circuits.

[BibT_eX]

[DOI]

Bodhisatwa Sadhu

Benjamin D. Parker

Mihai A. T. Sanduleanu

José A. Tierno

Daniel J. Friedman

IEEE Trans. Circuits Syst. I Regul. Pap., 2014

Multiple-Population Moment Estimation: Exploiting Interpopulation Correlation for Efficient Moment Estimation in Analog/Mixed-Signal Validation.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Adaptive Circuit Design Methodology and Test Applied to Millimeter-Wave Circuits.

[BibT_eX]

[DOI]

Benjamin D. Parker

Mihai A. T. Sanduleanu

Andreea Balteanu

Bodhisatwa Sadhu

Daniel J. Friedman

IEEE Des. Test, 2014

Multiple-Population Moment Estimation: Exploiting Inter-Population Correlation for Efficient Moment Estimation in Analog/Mixed-Signal Validation.

[BibT_eX]

[DOI]

CoRR, 2014

Environment-Adaptable Efficient Optimization for Programming of Reconfigurable Radio Frequency (RF) Receivers.

[BibT_eX]

[DOI]

Proceedings of the 2014 IEEE Military Communications Conference, 2014

Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling.

[BibT_eX]

[DOI]

Shanghang Zhang

Ronald D. Blanton

José Machado da Silva

John M. Carulli Jr.

Kenneth M. Butler

Proceedings of the 2014 International Test Conference, 2014

SLIC: Statistical learning in chip.

[BibT_eX]

[DOI]

Proceedings of the 2014 International Symposium on Integrated Circuits (ISIC), 2014

Ultra-low-power biomedical circuit design and optimization: Catching the don't cares.

[BibT_eX]

[DOI]

Proceedings of the 2014 International Symposium on Integrated Circuits (ISIC), 2014

DALM-SVD: Accelerated sparse coding through singular value decomposition of the dictionary.

[BibT_eX]

[DOI]

Hugo R. Gonçalves

Miguel V. Correia

Vítor Tavares

Proceedings of the 2014 IEEE International Conference on Image Processing, 2014

MPME-DP: multi-population moment estimation via dirichlet process for efficient validation of analog/mixed-signal circuits.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

Reduction and IR-drop compensations techniques for reliable neuromorphic computing systems.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

Verification based ECG biometrics with cardiac irregular conditions using heartbeat level and segment level information fusion.

[BibT_eX]

[DOI]

Ming Li

Proceedings of the IEEE International Conference on Acoustics, 2014

Joint invariant estimation of RF impairments for reconfigurable Radio Frequency(RF) front-end.

[BibT_eX]

[DOI]

Proceedings of the 2014 IEEE GLOBECOM Workshops, Austin, TX, USA, December 8-12, 2014, 2014

Low-power hardware implementation of movement decoding for brain computer interface with reduced-resolution discrete cosine transform.

[BibT_eX]

[DOI]

Proceedings of the 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2014

BMF-BD: Bayesian Model Fusion on Bernoulli Distribution for Efficient Yield Estimation of Integrated Circuits.

[BibT_eX]

[DOI]

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

Computer-Aided Design of Machine Learning Algorithm: Training Fixed-Point Classifier for On-Chip Low-Power Implementation.

[BibT_eX]

[DOI]

Hassan Albalawi

Yuanning Li

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

Toward efficient programming of reconfigurable radio frequency (RF) receivers.

[BibT_eX]

[DOI]

Proceedings of the 19th Asia and South Pacific Design Automation Conference, 2014

Using relative-relevance of data pieces for efficient communication, with an application to Neural data acquisition.

[BibT_eX]

[DOI]

Proceedings of the 52nd Annual Allerton Conference on Communication, 2014

2013

Efficient Spatial Pattern Analysis for Variation Decomposition Via Robust Sparse Regression.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

A linearized, low-phase-noise VCO-based 25-GHz PLL with autonomic biasing.

[BibT_eX]

[DOI]

Alexander V. Rylyakov

IEEE J. Solid State Circuits, 2013

Formal verification of phase-locked loops using reachability analysis and continuization.

[BibT_eX]

[DOI]

Commun. ACM, 2013

Referee consensus: a platform technology for nonlinear optimization.

[BibT_eX]

[DOI]

Proceedings of the Extreme Science and Engineering Discovery Environment: Gateway to Discovery, 2013

PADRE: Physically-Aware Diagnostic Resolution Enhancement.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

Test data analytics - Exploring spatial and test-item correlations in production test data.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013

DREAMS: DFM rule EvAluation using manufactured silicon.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013

Automatic clustering of wafer spatial signatures.

[BibT_eX]

[DOI]

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data.

[BibT_eX]

[DOI]

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

Efficient moment estimation with extremely small sample size via bayesian inference for analog/mixed-signal validation.

[BibT_eX]

[DOI]

Eli Chiprout

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion.

[BibT_eX]

[DOI]

Bodhisatwa Sadhu

Benjamin D. Parker

Mihai A. T. Sanduleanu

José A. Tierno

Daniel J. Friedman

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits.

[BibT_eX]

[DOI]

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

2012

Efficient SRAM Failure Rate Prediction via Gibbs Sampling.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Verify level control criteria for multi-level cell flash memories and their applications.

[BibT_eX]

[DOI]

Yongjune Kim

Jaehong Kim

Jun Jin Kong

B. V. K. Vijaya Kumar

EURASIP J. Adv. Signal Process., 2012

Spatial variation decomposition via sparse regression.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on IC Design & Technology, 2012

Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

Post-silicon performance modeling and tuning of analog/mixed-signal circuits via Bayesian Model Fusion.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

An information-theoretic framework for optimal temperature sensor allocation and full-chip thermal monitoring.

[BibT_eX]

[DOI]

Proceedings of the 49th Annual Design Automation Conference 2012, 2012

Statistical design and optimization for adaptive post-silicon tuning of MEMS filters.

[BibT_eX]

[DOI]

Proceedings of the 49th Annual Design Automation Conference 2012, 2012

Large-scale statistical performance modeling of analog and mixed-signal circuits.

[BibT_eX]

[DOI]

Wangyang Zhang

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

A learning-based autoregressive model for fast transient thermal analysis of chip-multiprocessors.

[BibT_eX]

[DOI]

Proceedings of the 17th Asia and South Pacific Design Automation Conference, 2012

2011

Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Test cost reduction through performance prediction using virtual probe.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2011

Toward efficient spatial variation decomposition via sparse regression.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design, 2011

Task-related MEG source localization via discriminant analysis.

[BibT_eX]

[DOI]

Proceedings of the 33rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2011

Efficient incremental analysis of on-chip power grid via sparse approximation.

[BibT_eX]

[DOI]

Pei Sun

Ming Yuan Ting

Proceedings of the 48th Design Automation Conference, 2011

Rethinking memory redundancy: optimal bit cell repair for maximum-information storage.

[BibT_eX]

[DOI]

Proceedings of the 48th Design Automation Conference, 2011

Efficient SRAM failure rate prediction via Gibbs sampling.

[BibT_eX]

[DOI]

Changdao Dong

Proceedings of the 48th Design Automation Conference, 2011

Indirect phase noise sensing for self-healing voltage controlled oscillators.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011

2010

Finding Deterministic Solution From Underdetermined Equation: Large-Scale Performance Variability Modeling of Analog/RF Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

Real-Time Robust Signal Space Separation for Magnetoencephalography.

[BibT_eX]

[DOI]

IEEE Trans. Biomed. Eng., 2010

Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation.

[BibT_eX]

[DOI]

Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

Maximum-information storage system: Concept, implementation and application.

[BibT_eX]

[DOI]

Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference.

[BibT_eX]

[DOI]

Wangyang Zhang

Rob A. Rutenbar

Proceedings of the 47th Design Automation Conference, 2010

Toward efficient large-scale performance modeling of integrated circuits via multi-mode/multi-corner sparse regression.

[BibT_eX]

[DOI]

Proceedings of the 47th Design Automation Conference, 2010

2009

Regular Analog/RF Integrated Circuits Design Using Optimization With Recourse Including Ellipsoidal Uncertainty.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

Efficient statistical analysis of read timing failures in SRAM circuits.

[BibT_eX]

[DOI]

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits.

[BibT_eX]

[DOI]

Rob A. Rutenbar

R. D. (Shawn) Blanton

Proceedings of the 2009 International Conference on Computer-Aided Design, 2009

Efficient design-specific worst-case corner extraction for integrated circuits.

[BibT_eX]

[DOI]

Proceedings of the 46th Design Automation Conference, 2009

SRAM parametric failure analysis.

[BibT_eX]

[DOI]

Proceedings of the 46th Design Automation Conference, 2009

Finding deterministic solution from underdetermined equation: large-scale performance modeling by least angle regression.

[BibT_eX]

[DOI]

Proceedings of the 46th Design Automation Conference, 2009

2008

Quadratic Statistical MAX Approximation for Parametric Yield Estimation of Analog/RF Integrated Circuits.

[BibT_eX]

[DOI]

Yaping Zhan

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

Defining Statistical Timing Sensitivity for Logic Circuits With Large-Scale Process and Environmental Variations.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

Digital Circuit Design Challenges and Opportunities in the Era of Nanoscale CMOS.

[BibT_eX]

[DOI]

Proc. IEEE, 2008

Projection-Based Piecewise-Linear Response Surface Modeling for Strongly Nonlinear VLSI Performance Variations.

[BibT_eX]

[DOI]

Yu Cao

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

Statistical regression for efficient high-dimensional modeling of analog and mixed-signal performance variations.

[BibT_eX]

[DOI]

Hongzhou Liu

Proceedings of the 45th Design Automation Conference, 2008

Mismatch analysis and statistical design at 65 nm and below.

[BibT_eX]

[DOI]

Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

Variation-tolerant SRAM sense-amplifier timing using configurable replica bitlines.

[BibT_eX]

[DOI]

Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

2007

Asymptotic Probability Extraction for Nonnormal Performance Distributions.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007

Robust Analog/RF Circuit Design With Projection-Based Performance Modeling.

[BibT_eX]

[DOI]

Yang Xu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007

Adaptive post-silicon tuning for analog circuits: concept, analysis and optimization.

[BibT_eX]

[DOI]

Proceedings of the 2007 International Conference on Computer-Aided Design, 2007

Parameterized Macromodeling for Analog System-Level Design Exploration.

[BibT_eX]

[DOI]

Jian Wang

Proceedings of the 44th Design Automation Conference, 2007

Efficient Parametric Yield Extraction for Multiple Correlated Non-Normal Performance Distributions of Analog/RF Circuits.

[BibT_eX]

[DOI]

Proceedings of the 44th Design Automation Conference, 2007

2006

Statistical Performance Modeling and Optimization.

[BibT_eX]

[DOI]

Found. Trends Electron. Des. Autom., 2006

Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions.

[BibT_eX]

[DOI]

Proceedings of the 43rd Design Automation Conference, 2006

Architecture-aware FPGA placement using metric embedding.

[BibT_eX]

[DOI]

Proceedings of the 43rd Design Automation Conference, 2006

Active On-Die Suppression of Power Supply Noise.

[BibT_eX]

[DOI]

Gökçe Keskin

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006

2005

Performance-centering optimization for system-level analog design exploration.

[BibT_eX]

[DOI]

Proceedings of the 2005 International Conference on Computer-Aided Design, 2005

Projection-based performance modeling for inter/intra-die variations.

[BibT_eX]

[DOI]

Proceedings of the 2005 International Conference on Computer-Aided Design, 2005

Parameterized interconnect order reduction with explicit-and-implicit multi-parameter moment matching for inter/intra-die variations.

[BibT_eX]

[DOI]

Peng Li

Proceedings of the 2005 International Conference on Computer-Aided Design, 2005

Defining statistical sensitivity for timing optimization of logic circuits with large-scale process and environmental variations.

[BibT_eX]

[DOI]

Proceedings of the 2005 International Conference on Computer-Aided Design, 2005

Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction.

[BibT_eX]

[DOI]

Proceedings of the 2005 Design, 2005

Correlation-aware statistical timing analysis with non-gaussian delay distributions.

[BibT_eX]

[DOI]

Proceedings of the 42nd Design Automation Conference, 2005

OPERA: optimization with ellipsoidal uncertainty for robust analog IC design.

[BibT_eX]

[DOI]

Proceedings of the 42nd Design Automation Conference, 2005

2004

Asymptotic probability extraction for non-normal distributions of circuit performance.

[BibT_eX]

[DOI]

Proceedings of the 2004 International Conference on Computer-Aided Design, 2004

Robust analog/RF circuit design with projection-based posynomial modeling.

[BibT_eX]

[DOI]

Yang Xu

Proceedings of the 2004 International Conference on Computer-Aided Design, 2004

A frequency relaxation approach for analog/RF system-level simulation.

[BibT_eX]

[DOI]

Yang Xu

Peng Li

Proceedings of the 41th Design Automation Conference, 2004

STAC: statistical timing analysis with correlation.

[BibT_eX]

[DOI]