Sang H. Baeg

According to our database, Sang H. Baeg authored at least 4 papers between 2004 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2018

A single event upset tolerant latch design.

Haibin Wang, Xixi Dai, Yangsheng Wang, Issam Nofal, Li Cai, Zicai Shen, Wanxiu Sun, Jinshun Bi, Bo Li, Gang Guo, Li Chen, Sang H. Baeg

Microelectron. Reliab., 2018

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.

Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong

Microelectron. Reliab., 2018

2017

BPPT - Bulk potential protection technique for hardened sequentials.

Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2004

Removing JTAG Bottlenecks in System Interconnect Test.

Hong Shin Jun, Sung Soo Chung, Sang H. Baeg

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004