Adrian Evans

According to our database¹, Adrian Evans authored at least 28 papers between 1998 and 2022.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of three.

Timeline

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PhD thesis

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On csauthors.net:

Bibliography

2022

Improving DNN Fault Tolerance in Semantic Segmentation Applications.

[BibT_eX]

[DOI]

Stéphane Burel

Adrian Evans

Lorena Anghel

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

MOZART: Masking Outputs with Zeros for Architectural Robustness and Testing of DNN Accelerators.

[BibT_eX]

[DOI]

Stéphane Burel

Adrian Evans

Lorena Anghel

Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

Zero-Overhead Protection for CNN Weights.

[BibT_eX]

[DOI]

Stéphane Burel

Adrian Evans

Lorena Anghel

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2017

BPPT - Bulk potential protection technique for hardened sequentials.

[BibT_eX]

[DOI]

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety.

[BibT_eX]

[DOI]

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

IZIP: In-place zero overhead interconnect protection via PIP redundancy.

[BibT_eX]

[DOI]

Proceedings of the 12th IEEE International Conference on ASIC, 2017

2016

A Method to Design Single Error Correction Codes With Fast Decoding for a Subset of Critical Bits.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2016

RIIF-2: Toward the next generation reliability information interchange format.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

2015

A Class of SEC-DED-DAEC Codes Derived From Orthogonal Latin Square Codes.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2015

Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor.

[BibT_eX]

[DOI]

Mojtaba Ebrahimi

Adrian Evans

Mehdi Baradaran Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

New insights into the impact of SEUs in FPGA CRAMs.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2015

Analysis of advanced circuits for SET measurement.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Techniques for heavy ion microbeam analysis of FPGA SER sensitivty.

[BibT_eX]

[DOI]

Adrian Evans

Dan Alexandrescu

Veronique Ferlet-Cavrois

Kay-Obbe Voss

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Flip-flop SEU reduction through minimization of the temporal vulnerability factor (TVF).

[BibT_eX]

[DOI]

Adrian Evans

Enrico Costenaro

Arkady Bramnik

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

A call for cross-layer and cross-domain reliability analysis and management.

[BibT_eX]

[DOI]

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

2014

New approaches for synthesis of redundant combinatorial logic for selective fault tolerance.

[BibT_eX]

[DOI]

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

Managing SER costs of complex systems through Linear Programming.

[BibT_eX]

[DOI]

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

Connecting different worlds - Technology abstraction for reliability-aware design and Test.

[BibT_eX]

[DOI]

Christina Gimmler-Dumont

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales.

[BibT_eX]

[DOI]

Mojtaba Ebrahimi

Adrian Evans

Mehdi Baradaran Tahoori

Razi Seyyedi

Enrico Costenaro

Dan Alexandrescu

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Hot topic session 4A: Reliability analysis of complex digital systems.

[BibT_eX]

[DOI]

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance.

[BibT_eX]

[DOI]

Proceedings of the IEEE 19th Pacific Rim International Symposium on Dependable Computing, 2013

Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops.

[BibT_eX]

[DOI]

Proceedings of the International Symposium on Quality Electronic Design, 2013

Hierarchical RTL-based combinatorial SER estimation.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

State-aware single event analysis for sequential logic.

[BibT_eX]

[DOI]

Dan Alexandrescu

Enrico Costenaro

Adrian Evans

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

Error detection in ternary CAMs using bloom filters.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2013

2012

RIIF - Reliability information interchange format.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

Single event upset tolerance in flip-flop based microprocessor cores.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

1998

Functional Verification of Large ASICs.

[BibT_eX]

[DOI]

Proceedings of the 35th Conference on Design Automation, 1998

Adrian Evans

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