Rui Liu

According to our database, Rui Liu authored at least 12 papers between 2014 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2021

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor.

Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen

J. Electron. Test., 2021

2018

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.

Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong

Microelectron. Reliab., 2018

2017

BPPT - Bulk potential protection technique for hardened sequentials.

Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2016

A Built-in Single Event Upsets Detector for Sequential Cells.

Yuanqing Li, Haibin Wang, Lixiang Li, Li Chen, Rui Liu, Mo Chen

J. Electron. Test., 2016

A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets.

Yuanqing Li, Lixiang Li, Yuan Ma, Li Chen, Rui Liu, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen

J. Electron. Test., 2016

An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology.

Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li

J. Electron. Test., 2016

Total ionizing dose test facilities for micro-electronic circuits.

Haibin Wang, Rui Liu, Xuantian Li, Li Chen, David M. Hiemstra, Valeri Kirischian

Proceedings of the 2016 IEEE Canadian Conference on Electrical and Computer Engineering, 2016

2015

A Novel Built-in Current Sensor for N-WELL SET Detection.

Haibin Wang, Rui Liu, Li Chen, Jinshun Bi, Mulong Li, Yuanqing Li

J. Electron. Test., 2015

Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology.

Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen

J. Electron. Test., 2015

Analysis of advanced circuits for SET measurement.

Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Single Event Resilient Dynamic Logic Designs.

Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi

J. Electron. Test., 2014

New approaches for synthesis of redundant combinatorial logic for selective fault tolerance.

Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014