Li Chen

According to our database, Li Chen authored at least 38 papers between 2010 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2021

Radiation Tolerant SRAM Cell Design in 65nm Technology.

JianAn Wang, Xue Wu, Haonan Tian, Lixiang Li, Shuting Shi, Li Chen

J. Electron. Test., 2021

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor.

Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen

J. Electron. Test., 2021

2019

A Layout-Based Rad-Hard DICE Flip-Flop Design.

Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen

J. Electron. Test., 2019

A Low Power and Low Noise Voltage-Controlled Oscillator in 28-nm FDSOI Technology for Wireless Communication Applications.

Abdul Baseer Khan, Jaime Cardenas, Li Chen, Muhammad Raashid Khan, Aqeel Qureshi

Proceedings of the 2019 IEEE Canadian Conference of Electrical and Computer Engineering, 2019

A Radiation-Tolerant CML Voltage Controlled Oscillator in 28nm CMOS FDSOI.

Jaime Cardenas, Abdul Khan, Li Chen, Zhichao Zhang, Muhammad Khan

Proceedings of the 2019 IEEE Canadian Conference of Electrical and Computer Engineering, 2019

2018

A single event upset tolerant latch design.

Haibin Wang, Xixi Dai, Yangsheng Wang, Issam Nofal, Li Cai, Zicai Shen, Wanxiu Sun, Jinshun Bi, Bo Li, Gang Guo, Li Chen, Sang H. Baeg

Microelectron. Reliab., 2018

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.

Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong

Microelectron. Reliab., 2018

A SEE Insensitive CML Voltage Controlled Oscillator in 65nm CMOS.

Zhichao Zhang, Li Chen, Hormoz Djahanshahi

Proceedings of the 2018 IEEE Canadian Conference on Electrical & Computer Engineering, 2018

A Hardened-By-Design Technique for LC-Tank Voltage Controlled Oscillator.

Zhichao Zhang, Li Chen, Hormoz Djahanshahi

Proceedings of the 2018 IEEE Canadian Conference on Electrical & Computer Engineering, 2018

2017

SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology.

Haibin Wang, Ao Sheng, Shiqi Wang, Jinshun Bi, Li Chen, Xiaofeng Liu

Microelectron. Reliab., 2017

Wide range linearity improvement technique for linear wideband LNA.

Zhichao Zhang, Anh Dinh, Li Chen, Haibin Wang

IEICE Electron. Express, 2017

BPPT - Bulk potential protection technique for hardened sequentials.

Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2016

A 0.1-8 GHz wideband low-noise amplifier exploiting gain-enhanced noise-cancelling technique.

Zhichao Zhang, Anh Dinh, Li Chen

IEICE Electron. Express, 2016

Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits.

Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen, Gang Guo

J. Electron. Test., 2016

A Built-in Single Event Upsets Detector for Sequential Cells.

Yuanqing Li, Haibin Wang, Lixiang Li, Li Chen, Rui Liu, Mo Chen

J. Electron. Test., 2016

A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets.

Yuanqing Li, Lixiang Li, Yuan Ma, Li Chen, Rui Liu, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen

J. Electron. Test., 2016

An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology.

Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li

J. Electron. Test., 2016

Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory.

Qingyu Chen, Li Chen, Haibin Wang, Longsheng Wu, Yuanqing Li, Xing Zhao, Mo Chen

J. Electron. Test., 2016

Total ionizing dose test facilities for micro-electronic circuits.

Haibin Wang, Rui Liu, Xuantian Li, Li Chen, David M. Hiemstra, Valeri Kirischian

Proceedings of the 2016 IEEE Canadian Conference on Electrical and Computer Engineering, 2016

Single photon absorption laser facility for single event effect testing.

Michael Newton, Brook Danger, Li Chen, Ramaswami Sammynaiken, Haibin Wang, David M. Hiemstra, Valeri Kirischian

Proceedings of the 2016 IEEE Canadian Conference on Electrical and Computer Engineering, 2016

2015

A Novel Built-in Current Sensor for N-WELL SET Detection.

Haibin Wang, Rui Liu, Li Chen, Jinshun Bi, Mulong Li, Yuanqing Li

J. Electron. Test., 2015

Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology.

Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen

J. Electron. Test., 2015

Analysis of advanced circuits for SET measurement.

Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung

Proceedings of the IEEE International Reliability Physics Symposium, 2015

A novel asymmetrical SRAM cell tolerant to soft errors.

Lixiang Li, Yuanqing Li, Yuan Ma, Li Chen

Proceedings of the IEEE 28th Canadian Conference on Electrical and Computer Engineering, 2015

2014

Single Event Resilient Dynamic Logic Designs.

Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi

J. Electron. Test., 2014

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.

Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva

J. Electron. Test., 2014

The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits.

Yi Ren, Li Chen

J. Electron. Test., 2014

New approaches for synthesis of redundant combinatorial logic for selective fault tolerance.

Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

2013

A high linear broadband cascode LNA employing common-gate linearity enhancing technology.

Zhichao Zhang, Muhammad Raashid Khan, Anh Dinh, Li Chen

IEICE Electron. Express, 2013

A low noise figure 2-GHz bandwidth LNA using resistive feedback with additional input inductors.

Zhichao Zhang, Anh Dinh, Li Chen, Muhammad Raashid Khan

IEICE Electron. Express, 2013

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients.

Zhichao Zhang, Yi Ren, Li Chen, Nelson J. Gaspard, Arthur F. Witulski, W. Timothy Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken

J. Electron. Test., 2013

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.

Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno

J. Electron. Test., 2013

Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance.

Hao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong

Proceedings of the IEEE 19th Pacific Rim International Symposium on Dependable Computing, 2013

2012

Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter.

Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva

J. Electron. Test., 2012

A 2 GHz bandwidth LNA using resistive feedback with added inductor.

Zhichao Zhang, Anh Dinh, Li Chen

Proceedings of the IEEE International Conference on Ultra-Wideband, 2012

A broadband high linear LNA for GSM/LTE wireless communications.

Zhichao Zhang, Muhammad Raashid Khan, Li Chen, Anh Dinh

Proceedings of the 25th IEEE Canadian Conference on Electrical and Computer Engineering, 2012

2010

A new Bulk Built-In Current Sensing circuit for single-event transient detection.

Zhichao Zhang, Tao Wang, Li Chen, Jinsheng Yang

Proceedings of the 23rd Canadian Conference on Electrical and Computer Engineering, 2010

A wearable real-time fall detector based on Naive Bayes classifier.

Xiuxin Yang, Anh Dinh, Li Chen

Proceedings of the 23rd Canadian Conference on Electrical and Computer Engineering, 2010