Steven R. Novak

According to our database, Steven R. Novak authored at least 4 papers between 2015 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Silicon Reliability Characterization of Intel's Foveros 3D Integration Technology for Logic-on-Logic Die Stacking.

Chetan Prasad, Sunny Chugh, Hannes Greve, I-chen Ho, Enamul Kabir, Cheyun Lin, Mahjabin Maksud, Steven R. Novak, Benjamin Orr, Keun Woo Park, Anthony Schmitz, Zhizheng Zhang, Peng Bai, Doug B. Ingerly, Emre Armagan, Hsinwei Wu, Patrick N. Stover, Lance Hibbeler, Michael O'Day, Daniel Pantuso

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Modeling Framework for Transistor Aging Playback in Advanced Technology Nodes.

Inanc Meric, Stephen Ramey, Steven R. Novak, S. Gupta, S. P. Mudanai, Jeffrey Hicks

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2015

Transistor reliability variation correlation to threshold voltage.

Stephen Ramey, M. Chahal, P. Nayak, Steven R. Novak, Chetan Prasad, Jeffery Hicks

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Transistor aging and reliability in 14nm tri-gate technology.

Steven R. Novak, C. Parker, D. Becher, M. Liu, Marty Agostinelli, M. Chahal, P. Packan, P. Nayak, Stephen Ramey, S. Natarajan

Proceedings of the IEEE International Reliability Physics Symposium, 2015