Taku Umebayashi

According to our database, Taku Umebayashi authored at least 5 papers between 2013 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A 40 nm 2 kb MTJ-Based Non-Volatile SRAM Macro with Novel Data-Aware Store Architecture for Normally Off Computing.

Kenta Suzuki, Keizo Hiraga, Kazuhiro Bessho, Kimiyoshi Usami, Taku Umebayashi

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2021

Analog In-memory Computing in FeFET-based 1T1R Array for Edge AI Applications.

D. Saito, T. Kobayashi, Hiroki Koga, Nicolo Ronchi, Kaustuv Banerjee, Yusuke Shuto, Jun Okuno, Kenta Konishi, Luca Di Piazza, Arindam Mallik, Jan Van Houdt, Masanori Tsukamoto, K. Ohkuri, Taku Umebayashi, Takayuki Ezaki

Proceedings of the 2021 Symposium on VLSI Circuits, Kyoto, Japan, June 13-19, 2021, 2021

High-Endurance and Low-Voltage operation of 1T1C FeRAM Arrays for Nonvolatile Memory Application.

Jun Okuno, Takafumi Kunihiro, Kenta Konishi, Hideki Maemura, Yusuke Shuto, Fumitaka Sugaya, Monica Materano, Tarek Ali, Maximilian Lederer, Kati Kühnel, Konrad Seidel, Uwe Schroeder, Thomas Mikolajick, Masanori Tsukamoto, Taku Umebayashi

Proceedings of the IEEE International Memory Workshop, 2021

2017

4.6 A 1/2.3inch 20Mpixel 3-layer stacked CMOS Image Sensor with DRAM.

Tsutomu Haruta, Tsutomu Nakajima, Jun Hashizume, Taku Umebayashi, Hiroshi Takahashi, Kazuo Taniguchi, Masami Kuroda, Hiroshi Sumihiro, Koji Enoki, Takatsugu Yamasaki, Katsuya Ikezawa, Atsushi Kitahara, Masao Zen, Masafumi Oyama, Hiroki Koga, Hidenobu Tsugawa, Tomoharu Ogita, Takashi Nagano, Satoshi Takano, Tetsuo Nomoto

Proceedings of the 2017 IEEE International Solid-State Circuits Conference, 2017

2013

A 1/4-inch 8Mpixel back-illuminated stacked CMOS image sensor.

Shunichi Sukegawa, Taku Umebayashi, Tsutomu Nakajima, Hiroshi Kawanobe, Ken Koseki, Isao Hirota, Tsutomu Haruta, Masanori Kasai, Koji Fukumoto, Toshifumi Wakano, Keishi Inoue, Hiroshi Takahashi, Takashi Nagano, Yoshikazu Nitta, Teruo Hirayama, Noriyuki Fukushima

Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013