Thomas Beauchêne

According to our database, Thomas Beauchêne authored at least 5 papers between 2001 and 2003.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2003

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).

Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat

Microelectron. Reliab., 2003

A physical approach on SCOBIC investigation in VLSI.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto

Microelectron. Reliab., 2003

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles

Microelectron. Reliab., 2003

2002

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.

Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis

Microelectron. Reliab., 2002

2001

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.

Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu

Microelectron. Reliab., 2001