Vincent Goubier

According to our database, Vincent Goubier authored at least 6 papers between 2003 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.

Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2012

Effects of 1064 nm laser on MOS capacitor.

R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2012

2011

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory.

Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2011

2008

Effect of physical defect on shmoos in CMOS DSM technologies.

Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely

Microelectron. Reliab., 2008

Generic simulator for faulty IC.

Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier

Microelectron. Reliab., 2008

2003

Short defect characterization based on TCR parameter extraction.

Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis

Microelectron. Reliab., 2003