Fabien Essely

According to our database, Fabien Essely authored at least 5 papers between 2004 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

Effect of physical defect on shmoos in CMOS DSM technologies.

Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely

Microelectron. Reliab., 2008

2007

Investigation of a new method for dopant characterization.

Jérôme Adrian, Nicolas Rodriguez, Fabien Essely, Gérald Haller, Catherine Grosjean, Alain Portavoce, Christophe Girardeaux

Microelectron. Reliab., 2007

2006

Application of various optical techniques for ESD defect localization.

Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2006

2005

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.

Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2005

2004

Study of the ESD defects impact on ICs reliability.

Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2004