Jean-Max Dutertre

According to our database1, Jean-Max Dutertre authored at least 70 papers between 2001 and 2021.

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Bibliography

2021
An Overview of Laser Injection against Embedded Neural Network Models.
Proceedings of the 7th IEEE World Forum on Internet of Things, 2021

Permanent Laser Fault Injection into the Flash Memory of a Microcontroller.
Proceedings of the 19th IEEE International New Circuits and Systems Conference, 2021

Luring Transferable Adversarial Perturbations for Deep Neural Networks.
Proceedings of the International Joint Conference on Neural Networks, 2021

FaultLine: Software-Based Fault Injection on Memory Transfers.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2021

Laser Fault Injection in a 32-bit Microcontroller: from the Flash Interface to the Execution Pipeline.
Proceedings of the 18th Workshop on Fault Detection and Tolerance in Cryptography, 2021

Analysis of a Laser-induced Instructions Replay Fault Model in a 32-bit Microcontroller.
Proceedings of the 24th Euromicro Conference on Digital System Design, 2021

Further Analysis of Laser-induced IR-drop.
Proceedings of the 30th IEEE Asian Test Symposium, 2021

2020
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

SideLine: How Delay-Lines (May) Leak Secrets from your SoC.
IACR Cryptol. ePrint Arch., 2020

Luring of Adversarial Perturbations.
CoRR, 2020

Electromagnetic Fault Injection as a New Forensic Approach for SoCs.
Proceedings of the 12th IEEE International Workshop on Information Forensics and Security, 2020

Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell.
Proceedings of the 33rd Symposium on Integrated Circuits and Systems Design, 2020

Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation.
Proceedings of the 17th Workshop on Fault Detection and Tolerance in Cryptography, 2020

Experimental Analysis of the Electromagnetic Instruction Skip Fault Model.
Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

2019
High-Speed Ring Oscillator based Sensors for Remote Side-Channel Attacks on FPGAs.
Proceedings of the 2019 International Conference on ReConFigurable Computing and FPGAs, 2019

Experimental Analysis of the Laser-Induced Instruction Skip Fault Model.
Proceedings of the Secure IT Systems, 2019

Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

Precise Spatio-Temporal Electromagnetic Fault Injections on Data Transfers.
Proceedings of the 2019 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2019

Impact of Low-Bitwidth Quantization on the Adversarial Robustness for Embedded Neural Networks.
Proceedings of the 2019 International Conference on Cyberworlds, 2019

Remote Side-Channel Attacks on Heterogeneous SoC.
Proceedings of the Smart Card Research and Advanced Applications, 2019

2018
Assessing body built-in current sensors for detection of multiple transient faults.
Microelectron. Reliab., 2018

Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller.
IACR Cryptol. ePrint Arch., 2018

Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits.
Proceedings of the 2018 International Symposium on Physical Design, 2018

The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model.
Proceedings of the 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2018

2017
Method for evaluation of transient-fault detection techniques.
Microelectron. Reliab., 2017

Importance of IR drops on the modeling of laser-induced transient faults.
Proceedings of the 14th International Conference on Synthesis, 2017

Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation.
Proceedings of the Euromicro Conference on Digital System Design, 2017

2016
Frontside Versus Backside Laser Injection: A Comparative Study.
ACM J. Emerg. Technol. Comput. Syst., 2016

Body Biasing Injection Attacks in Practice.
Proceedings of the Third Workshop on Cryptography and Security in Computing Systems, 2016

On the use of Forward Body Biasing to decrease the repeatability of laser-induced faults.
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Photonic Power Firewalls.
Proceedings of the New Codebreakers, 2016

2015
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation.
Microelectron. Reliab., 2015

Figure of Merits of 28nm Si Technologies for Implementing Laser Attack Resistant Security Dedicated Circuits.
Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses.
Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents.
Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

Evidence of an information leakage between logically independent blocks.
Proceedings of the Second Workshop on Cryptography and Security in Computing Systems, 2015

SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology.
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

Influence of triple-well technology on laser fault injection and laser sensor efficiency.
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

2014
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.
Microelectron. Reliab., 2014

Electromagnetic analysis and fault injection onto secure circuits.
Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014



Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter.
Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, 2014

Laser attacks on integrated circuits: From CMOS to FD-SOI.
Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

Efficiency of a glitch detector against electromagnetic fault injection.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Evidence of a Larger EM-Induced Fault Model.
Proceedings of the Smart Card Research and Advanced Applications, 2014

2013
Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell.
Microelectron. Reliab., 2013

Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection.
Microelectron. Reliab., 2013

Practical measurements of data path delays for IP authentication & integrity verification.
Proceedings of the 2013 8th International Workshop on Reconfigurable and Communication-Centric Systems-on-Chip (ReCoSoC), 2013

A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults.
Proceedings of the 2013 23rd International Workshop on Power and Timing Modeling, 2013

Power supply glitch induced faults on FPGA: An in-depth analysis of the injection mechanism.
Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

Frontside laser fault injection on cryptosystems - Application to the AES' last round -.
Proceedings of the 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, 2013

A bulk built-in sensor for detection of fault attacks.
Proceedings of the 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, 2013

Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells.
Proceedings of the 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2013

Robustness improvement of an SRAM cell against laser-induced fault injection.
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

Differential analysis of Round-Reduced AES faulty ciphertexts.
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

Electromagnetic Glitch on the AES Round Counter.
Proceedings of the Constructive Side-Channel Analysis and Secure Design, 2013

2012
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.
Microelectron. Reliab., 2012

Injection of transient faults using electromagnetic pulses -Practical results on a cryptographic system-.
IACR Cryptol. ePrint Arch., 2012

Fault Round Modification Analysis of the advanced encryption standard.
Proceedings of the 2012 IEEE International Symposium on Hardware-Oriented Security and Trust, 2012

A DFA on AES Based on the Entropy of Error Distributions.
Proceedings of the 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2012

Electromagnetic Transient Faults Injection on a Hardware and a Software Implementations of AES.
Proceedings of the 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2012

2011
Design and characterisation of an AES chip embedding countermeasures.
Int. J. Intell. Eng. Informatics, 2011

A side-channel and fault-attack resistant AES circuit working on duplicated complemented values.
Proceedings of the IEEE International Solid-State Circuits Conference, 2011

2010
Experimental Fault Injection based on the Prototyping of an AES Cryptosystem.
Proceedings of the 5th International Workshop on Reconfigurable Communication-centric Systems on Chip, 2010

How to flip a bit?
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

When Clocks Fail: On Critical Paths and Clock Faults.
Proceedings of the Smart Card Research and Advanced Application, 2010

2001
Integration of Robustness in the Design of a Cell.
Proceedings of the SOC Design Methodologies, 2001


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