Jean-Max Dutertre
Orcid: 0000-0002-2251-7815
According to our database1,
Jean-Max Dutertre
authored at least 89 papers
between 2001 and 2024.
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Bibliography
2024
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., March, 2024
2023
J. Hardw. Syst. Secur., March, 2023
Microprocess. Microsystems, 2023
Evaluation of Parameter-Based Attacks Against Embedded Neural Networks with Laser Injection.
Proceedings of the Computer Safety, Reliability, and Security, 2023
CIFER: Code Integrity and control Flow verification for programs Executed on a RISC-V core.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2023
Lightweight Countermeasures Against Original Linear Code Extraction Attacks on a RISC-V Core.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2023
Proceedings of the Workshop on Fault Detection and Tolerance in Cryptography, 2023
Fault Injection and Safe-Error Attack for Extraction of Embedded Neural Network Models.
Proceedings of the Computer Security. ESORICS 2023 International Workshops, 2023
Proceedings of the 26th Euromicro Conference on Digital System Design, 2023
Proceedings of the 26th Euromicro Conference on Digital System Design, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Proceedings of the Constructive Side-Channel Analysis and Secure Design, 2023
2022
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022
An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022
Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2022
Proceedings of the 25th Euromicro Conference on Digital System Design, 2022
Injecting Permanent Faults into the Flash Memory of a Microcontroller with Laser Illumination During Read Operations.
Proceedings of the 2022 Workshop on Attacks and Solutions in Hardware Security, 2022
2021
Proceedings of the 7th IEEE World Forum on Internet of Things, 2021
Proceedings of the 19th IEEE International New Circuits and Systems Conference, 2021
Proceedings of the International Joint Conference on Neural Networks, 2021
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2021
Laser Fault Injection in a 32-bit Microcontroller: from the Flash Interface to the Execution Pipeline.
Proceedings of the 18th Workshop on Fault Detection and Tolerance in Cryptography, 2021
Analysis of a Laser-induced Instructions Replay Fault Model in a 32-bit Microcontroller.
Proceedings of the 24th Euromicro Conference on Digital System Design, 2021
Proceedings of the 30th IEEE Asian Test Symposium, 2021
2020
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
IACR Cryptol. ePrint Arch., 2020
Proceedings of the 12th IEEE International Workshop on Information Forensics and Security, 2020
Proceedings of the 33rd Symposium on Integrated Circuits and Systems Design, 2020
Proceedings of the 17th Workshop on Fault Detection and Tolerance in Cryptography, 2020
Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020
2019
Proceedings of the 2019 International Conference on ReConFigurable Computing and FPGAs, 2019
Proceedings of the Secure IT Systems, 2019
Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019
Proceedings of the 2019 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2019
Impact of Low-Bitwidth Quantization on the Adversarial Robustness for Embedded Neural Networks.
Proceedings of the 2019 International Conference on Cyberworlds, 2019
Proceedings of the Smart Card Research and Advanced Applications, 2019
2018
Microelectron. Reliab., 2018
Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller.
IACR Cryptol. ePrint Arch., 2018
Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits.
Proceedings of the 2018 International Symposium on Physical Design, 2018
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model.
Proceedings of the 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2018
2017
Microelectron. Reliab., 2017
Proceedings of the 14th International Conference on Synthesis, 2017
Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation.
Proceedings of the Euromicro Conference on Digital System Design, 2017
2016
ACM J. Emerg. Technol. Comput. Syst., 2016
Proceedings of the Third Workshop on Cryptography and Security in Computing Systems, 2016
On the use of Forward Body Biasing to decrease the repeatability of laser-induced faults.
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016
2015
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation.
Microelectron. Reliab., 2015
Figure of Merits of 28nm Si Technologies for Implementing Laser Attack Resistant Security Dedicated Circuits.
Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015
Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents.
Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015
Proceedings of the Second Workshop on Cryptography and Security in Computing Systems, 2015
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology.
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015
Influence of triple-well technology on laser fault injection and laser sensor efficiency.
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015
2014
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.
Microelectron. Reliab., 2014
Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014
Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014
Proceedings of the VLSI-SoC: Internet of Things Foundations, 2014
Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter.
Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, 2014
Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014
Proceedings of the Smart Card Research and Advanced Applications, 2014
2013
Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell.
Microelectron. Reliab., 2013
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection.
Microelectron. Reliab., 2013
Practical measurements of data path delays for IP authentication & integrity verification.
Proceedings of the 2013 8th International Workshop on Reconfigurable and Communication-Centric Systems-on-Chip (ReCoSoC), 2013
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults.
Proceedings of the 2013 23rd International Workshop on Power and Timing Modeling, 2013
Power supply glitch induced faults on FPGA: An in-depth analysis of the injection mechanism.
Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013
Frontside laser fault injection on cryptosystems - Application to the AES' last round -.
Proceedings of the 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, 2013
Proceedings of the 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, 2013
Proceedings of the 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2013
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013
Proceedings of the Constructive Side-Channel Analysis and Secure Design, 2013
2012
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.
Microelectron. Reliab., 2012
Injection of transient faults using electromagnetic pulses -Practical results on a cryptographic system-.
IACR Cryptol. ePrint Arch., 2012
Proceedings of the 2012 IEEE International Symposium on Hardware-Oriented Security and Trust, 2012
Proceedings of the 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2012
Electromagnetic Transient Faults Injection on a Hardware and a Software Implementations of AES.
Proceedings of the 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2012
2011
Int. J. Intell. Eng. Informatics, 2011
A side-channel and fault-attack resistant AES circuit working on duplicated complemented values.
Proceedings of the IEEE International Solid-State Circuits Conference, 2011
2010
Experimental Fault Injection based on the Prototyping of an AES Cryptosystem.
Proceedings of the 5th International Workshop on Reconfigurable Communication-centric Systems on Chip, 2010
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010
Proceedings of the Smart Card Research and Advanced Application, 2010
2001
Integration of Robustness in the Design of a Cell.
Proceedings of the SOC Design Methodologies, 2001