Walter E. Calienes Bartra

According to our database, Walter E. Calienes Bartra authored at least 9 papers between 2012 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures.

Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt

Proceedings of the 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2023

2017

Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition.

Walter E. Calienes Bartra, Y. Q. de Aguiar, Cristina Meinhardt, Andrei Vladimirescu, Ricardo Augusto da Luz Reis

Microelectron. Reliab., 2017

Process and temperature impact on single-event transients in 28nm FDSOI CMOS.

Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Reis

Proceedings of the 8th IEEE Latin American Symposium on Circuits & Systems, 2017

2016

FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects.

Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Augusto da Luz Reis

Microelectron. Reliab., 2016

2015

Modeling the impact of heavy ion on FDSOI NanoCMOS.

Walter E. Calienes Bartra, Ricardo Reis, Andrei Vladimirescu

Proceedings of the IEEE 6th Latin American Symposium on Circuits & Systems, 2015

Bulk and FDSOI Sub-micron CMOS transistors resilience to single-event transients.

Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Reis

Proceedings of the 2015 IEEE International Conference on Electronics, 2015

2014

Bulk and FDSOI SRAM resiliency to radiation effects.

Walter E. Calienes Bartra, Ricardo Augusto da Luz Reis, Costin Anghel, Andrei Vladimirescu

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

A set of Virtual Instruments to simulate radiation effects in CMOS circuits.

Walter E. Calienes Bartra, Ricardo Reis

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2014

2012

Simulation of SET faults in a voltage controlled oscillator.

Walter E. Calienes Bartra, Fernanda Lima Kastensmidt, Ricardo Reis

Proceedings of the 13th Latin American Test Workshop, 2012