Wolfgang Molzer

According to our database, Wolfgang Molzer authored at least 3 papers between 2007 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Thermal issues in test: An overview of the significant aspects and industrial practice.

Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2007

On the device design assessment of multigate FETs (MuGFETs) using full process and device simulation with 3D TCAD.

Muhammad Nawaz, Wolfgang Molzer, Stefan Decker, Luis-Felipe Giles, Thomas Schulz

Microelectron. J., 2007

A merged MuGFET and planar SOI process.

Andrew Marshall, C. Rinn Cleavelin, Weize Xiong, Christian Pacha, Gerhard Knoblinger, Klaus Von Armin, Thomas Schulz, Klaus Schruefer, Ken Matthews, Wolfgang Molzer, Paul Patruno, Christian Russ

Proceedings of the 2007 IEEE International SOC Conference, 2007