Juergen Alt

According to our database, Juergen Alt authored at least 4 papers between 2010 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

New Approaches for Power Binning of High Performance Microprocessors.

Martin Omaña, Marco Padovani, Kreshnik Veliu, Cecilia Metra, Juergen Alt, Rajesh Galivanche

IEEE Trans. Computers, 2017

2016

Thermal issues in test: An overview of the significant aspects and industrial practice.

Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Supply-voltage optimization to account for process variations in high-volume manufacturing testing.

Gurunath Kadam, Markus Rudack, Krishnendu Chakrabarty, Juergen Alt

Proceedings of the 2016 IEEE International Test Conference, 2016

2010

Production test challenges for highly integrated mobile phone SOCs - A case study.

Frank Poehl, Frank Demmerle, Juergen Alt, Hermann Obermeir

Proceedings of the 15th European Test Symposium, 2010