Andreas Leininger

According to our database, Andreas Leininger authored at least 13 papers between 2004 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

Thermal issues in test: An overview of the significant aspects and industrial practice.

Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Improving SRAM test quality by leveraging self-timed circuits.

Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2011

Masking of X-Values by Use of a Hierarchically Configurable Register.

Thomas Rabenalt, Michael Gössel, Andreas Leininger

J. Electron. Test., 2011

2009

X-tolerant Test Data Compaction with Accelerated Shift Registers.

Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel

J. Electron. Test., 2009

Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment.

Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger

Proceedings of the 14th IEEE European Test Symposium, 2009

2008

Accelerated Shift Registers for X-tolerant Test Data Compaction.

Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel

Proceedings of the 13th European Test Symposium, 2008

2007

Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques.

Andreas Leininger, Martin Fischer, Michael Richter, Michael Gössel

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

New diagnosis and test methods with high compaction rates.

Andreas Leininger

PhD thesis, 2006

The Next Step in Volume Scan Diagnosis: Standard Fail Data Format.

Andreas Leininger, Ajay Khoche, Martin Fischer, Nagesh Tamarapalli, Wu-Tung Cheng, Randy Klingenberg, Wu Yang

Proceedings of the 15th Asian Test Symposium, 2006

2005

Compression mode diagnosis enables high volume monitoring diagnosis flow.

Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Evaluating ATE-equipment for volume diagnosis.

Ralf Arnold, Andreas Leininger

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST.

Michael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger

J. Electron. Test., 2004

Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code.

Andreas Leininger, Michael Gössel, Peter Muhmenthaler

Proceedings of the 2004 Design, 2004