Alireza Rohani

According to our database, Alireza Rohani authored at least 13 papers between 2009 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Thermal issues in test: An overview of the significant aspects and industrial practice.

Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

A software framework to calculate local temperatures in CMOS processors.

Alireza Rohani, Hassan Ebrahimi, Hans G. Kerkhoff

Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016

Detecting intermittent resistive faults in digital CMOS circuits.

Hassan Ebrahimi, Alireza Rohani, Hans G. Kerkhoff

Proceedings of the 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2016

2015

On the maximization of the sustained switching activity in a processor.

Riccardo Cantoro, Matteo Sonza Reorda, Alireza Rohani, Hans G. Kerkhoff

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

2014

Two soft-error mitigation techniques for functional units of DSP processors.

Alireza Rohani, Hans G. Kerkhoff

Proceedings of the 19th IEEE European Test Symposium, 2014

2013

Rapid transient fault insertion in large digital systems.

Alireza Rohani, Hans G. Kerkhoff

Microprocess. Microsystems, 2013

Pulse-length determination techniques in the rectangular single event transient fault model.

Alireza Rohani, Hans G. Kerkhoff, Enrico Costenaro, Dan Alexandrescu

Proceedings of the 2013 International Conference on Embedded Computer Systems: Architectures, 2013

2012

An on-line soft error mitigation technique for control logic of VLIW processors.

Alireza Rohani, Hans G. Kerkhoff

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

2011

Study of the effects of SET induced faults on submicron technologies.

Alireza Rohani, Hans G. Kerkhoff

Proceedings of the IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2011), 2011

A Technique for Accelerating Injection of Transient Faults in Complex SoCs.

Alireza Rohani, Hans G. Kerkhoff

Proceedings of the 14th Euromicro Conference on Digital System Design, 2011

2010

Two effective methods to mitigate soft error effects in SRAM-based FPGAs.

Alireza Rohani, Hamid R. Zarandi

Microelectron. Reliab., 2010

2009

A New CLB Architecture for Tolerating SEU in SRAM-Based FPGAs.

Alireza Rohani, Hamid R. Zarandi

Proceedings of the ReConFig'09: 2009 International Conference on Reconfigurable Computing and FPGAs, 2009

An Analysis of Fault Effects and Propagations in AVR Microcontroller ATmega103(L).

Alireza Rohani, Hamid R. Zarandi

Proceedings of the The Forth International Conference on Availability, 2009