Xiao Shi
Orcid: 0000-0003-1152-0055Affiliations:
- Nanjing University, National Center of Technology Innovation for EDA, China
- University of California Los Angeles, Electrical and Computer Engineering Department, CA, USA (former)
- Fudan University, Microelectronics Department, Shanghai, China (former)
- Southeast University, School of Electronic Science and Engineering, Nanjing, China (former)
According to our database1,
Xiao Shi
authored at least 20 papers
between 2012 and 2025.
Collaborative distances:
Collaborative distances:
Timeline
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Bibliography
2025
Integr., 2025
2024
IEEE Trans. Circuits Syst. Video Technol., November, 2024
Efficient Memory Circuits Yield Analysis and Optimization Framework via Meta-Learning.
IEEE Trans. Circuits Syst. II Express Briefs, September, 2024
High-Dimensional Yield Analysis Using Sparse Representation for Long-Tailed Distribution.
Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD, 2024
LVF2: A Statistical Timing Model based on Gaussian Mixture for Yield Estimation and Speed Binning.
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024
2023
CharTM: The dynamic stability characterization for memory based on tail distribution modeling.
Microelectron. J., March, 2023
An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated.
Integr., March, 2023
Proceedings of the 33rd International Conference on Field-Programmable Logic and Applications, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
2022
A Compact High-Dimensional Yield Analysis Method using Low-Rank Tensor Approximation.
ACM Trans. Design Autom. Electr. Syst., 2022
2021
Proceedings of the ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, 2021
2020
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
A Non-Gaussian Adaptive Importance Sampling Method for High-Dimensional and Multi-Failure-Region Yield Analysis.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020
Proceedings of the 57th ACM/IEEE Design Automation Conference, 2020
2019
Adaptive Clustering and Sampling for High-Dimensional and Multi-Failure-Region SRAM Yield Analysis.
Proceedings of the 2019 International Symposium on Physical Design, 2019
Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model based Importance Sampling Method.
Proceedings of the International Conference on Computer-Aided Design, 2019
Meta-Model based High-Dimensional Yield Analysis using Low-Rank Tensor Approximation.
Proceedings of the 56th Annual Design Automation Conference 2019, 2019
Adaptive Low-Rank Tensor Approximation for SRAM Yield Analysis using Bootstrap Resampling.
Proceedings of the 13th IEEE International Conference on ASIC, 2019
2018
A fast and robust failure analysis of memory circuits using adaptive importance sampling method.
Proceedings of the 55th Annual Design Automation Conference, 2018
2012
Proceedings of the 6th International Conference on Signal Processing and Communication Systems, 2012