Yu-Shen Yang
  According to our database1,
  Yu-Shen Yang
  authored at least 16 papers
  between 2003 and 2014.
  
  
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
  2014
Simulation and satisfiability guided counter-example triage for RTL design debugging.
    
  
    Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014
    
  
  2013
    Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013
    
  
  2012
    IEEE Trans. Very Large Scale Integr. Syst., 2012
    
  
    Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012
    
  
    Proceedings of the 17th Asia and South Pacific Design Automation Conference, 2012
    
  
  2011
    IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011
    
  
  2010
Automated silicon debug data analysis techniques for a hardware data acquisition environment.
    
  
    Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010
    
  
  2009
    Proceedings of the Design, Automation and Test in Europe, 2009
    
  
    Proceedings of the Design, Automation and Test in Europe, 2009
    
  
  2008
On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD.
    
  
    Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008
    
  
  2007
    Proceedings of the 12th Conference on Asia South Pacific Design Automation, 2007
    
  
  2006
Extraction error modeling and automated model debugging in high-performance custom designs.
    
  
    IEEE Trans. Very Large Scale Integr. Syst., 2006
    
  
    Proceedings of the 2006 IEEE International Test Conference, 2006
    
  
  2005
Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs.
    
  
    Proceedings of the 2005 Design, 2005
    
  
  2003
Extraction Error Analysis, Diagnosis and Correction in Custom-Made High-Performance Designs.
    
  
    Proceedings of the Fourth International Workshop on Microprocessor Test and Verification, 2003
    
  
    Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003