Sean Safarpour

Affiliations:
  • University of Toronto, Canada


According to our database1, Sean Safarpour authored at least 28 papers between 2004 and 2011.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

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Online presence:

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Bibliography

2011
Toward Automated ECOs in FPGAs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Debugging with dominance: On-the-fly RTL debug solution implications.
Proceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design, 2011

Automated debugging of SystemVerilog assertions.
Proceedings of the Design, Automation and Test in Europe, 2011

From RTL to silicon: The case for automated debug.
Proceedings of the 16th Asia South Pacific Design Automation Conference, 2011

2010
Bounded Model Debugging.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

Automated Design Debugging With Maximum Satisfiability.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

An Automated Framework for Correction and Debug of PSL Assertions.
Proceedings of the 11th International Workshop on Microprocessor Test and Verification, 2010

Automated silicon debug data analysis techniques for a hardware data acquisition environment.
Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Managing verification error traces with bounded model debugging.
Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

2009
Automated Design Debugging With Abstraction and Refinement.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

Automated debugging with high level abstraction and refinement.
Proceedings of the IEEE International High Level Design Validation and Test Workshop, 2009

Spatial and temporal design debug using partial MaxSAT.
Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, 2009

Towards automated ECOs in FPGAs.
Proceedings of the ACM/SIGDA 17th International Symposium on Field Programmable Gate Arrays, 2009

The day Sherlock Holmes decided to do EDA.
Proceedings of the 46th Design Automation Conference, 2009

2008
Improved SAT-based Reachability Analysis with Observability Don't Cares.
J. Satisf. Boolean Model. Comput., 2008

2007
A performance-driven QBF-based iterative logic array representation with applications to verification, debug and test.
Proceedings of the 2007 International Conference on Computer-Aided Design, 2007

Improved Design Debugging Using Maximum Satisfiability.
Proceedings of the Formal Methods in Computer-Aided Design, 7th International Conference, 2007

Maximum circuit activity estimation using pseudo-boolean satisfiability.
Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

Trace Compaction using SAT-based Reachability Analysis.
Proceedings of the 12th Conference on Asia South Pacific Design Automation, 2007

2006
Abstraction and Refinement Techniques in Automated Design Debugging.
Proceedings of the Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), 2006

Integrating observability don't cares in all-solution SAT solvers.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

On the relation between simulation-based and SAT-based diagnosis.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006

Efficient SAT-based Boolean matching for FPGA technology mapping.
Proceedings of the 43rd Design Automation Conference, 2006

2005
Post-Verification Debugging of Hierarchical Designs.
Proceedings of the Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), 2005

Utilizing don't care states in SAT-based bounded sequential problems.
Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, 2005

Diagnosing multiple transition faults in the absence of timing information.
Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, 2005

2004
Debugging Sequential Circuits Using Boolean Satisfiability.
Proceedings of the Fifth International Workshop on Microprocessor Test and Verification (MTV 2004), 2004

Managing Don't Cares in Boolean Satisfiability.
Proceedings of the 2004 Design, 2004


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